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Semicon
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
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product
Semicon Test Probes
Fine pitch, 0.20 mm [8 Mil] - single & double ended - non-rotating - kelvin - RF - high performance.
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product
Wafer Edge Profile Measurement
WATOM
WATOM can carry out fully automatic, non-contact measurements of the edge profiles and diameter in accordance with SEMICON standards. A special feature is the system's ability to make measurements of the mark cut into the edge of the wafer to indicate the crystal orientation. Because of its high measurement accuracy of less than 1.5 µm, leading wafer manufacturers across the world use WATOM for shop-floor geometrical quality control.
