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NF
1) EMF closest to the antenna. 2) Near-field optics.
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Cylinder type, Near field Antenna Measurement System
anm02
As it combines the vertical direction of the probe antenna with the turn of the object antenna, and performs the near field measurement in the shape of a cylinder. The result will be converted to far field. Feature The pattern behind the antenna can be measured by a cylinder scanning. Fast measurement.For example ) Vertical direction 256 point and Rotatory direction 180 point : 30 minutes.
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EMC Accessories
Complete your EMC test setup with the essential accessories to compliment the test equipment. Whether it is a LISN (or V-Network) to counteract interference from external power sources on conducted emissions from the device under test, probes to locate the near field sources of radiated emissions, receive and transmit antennas, or tripods for holding antennas in place, the Rohde & Schwarz catalog of EMC accessories provides the additional items you need for EMI and EMS measurements, guaranteed 100% suitable for use with Rohde & Schwarz EMC test equipment.
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EMC Scanner
EMxpert
EMXpert is a unique magnetic near field scanning system that helps designers be highly productive in understanding and diagnosing these problems, quickly and early in the development cycle.
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Heavy Duty Modular Connector
HyperMod Series
Smiths Interconnects’ heavy duty, modular, rectangular HyperMod Series is available with a variety of contacts, special shells for harsh environments and special high creepage/clearance modules. The series conforms to DIN 43652 standards and is NF F61-030 railways approved.
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Impedance/Game-Phase Analyzers
A/D converted input signals undergo discrete Fourier transform (DFT) to calculate complex impedance values and obtain parameters and characteristics specific to the DUT, such as its capacitance, inductance and quality factor. Original NF algorithms are also applied to allow equivalent circuits made up of R, L and C along with the constants for those circuits to be estimated from the complex impedance spectrum obtained by sweeping the frequencies.
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Loudspeaker-Microphone Probe
Zircon
The Zircon is a loudspeaker-microphone probe for measuring in situ the absorption and reflection properties of surfaces. These may be indoor surfaces, such as in concert halls and gyms, or outdoor surfaces, such as road surfaces (ISO 13472-1), sound barriers installed in a free field (NF S 31-089) and traffic noise reducing devices (CEN/TS 1793-5)
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Microscope Photoluminescence Spectrometer
Flex One
Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields.
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Near-Field Detection Module for Imaging
Reflection
Reflective AFM-tip illuminationDetection optimized for high-performance near-field imagingEnables optical amplitude and phase resolved near field measurementsNear-field spectroscopy possible via sequential imaging (Requires tunable illumination unit)Patented background-free detection technologySuited for visible & infrared wavelength range (0.5 20 m)Version for infrared & THz wavelength range (5 300 m) availableSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution
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Near-Field Detection Module for Imaging
Transmission
Detection optimized for high performance near-field imaging in transmission-modeEnables optical amplitude and phase resolved near field measurementsPatented background-free detection technologyEnables bottom-side (transmission-mode) sample illumination with broadband mirrorSuited for visible and infrared wavelength range 0.5 20 mRequires transparent sample substrateMotorized parabolic mirror for easy beam-alignment in transmission-modeStationary focal point with respect to AFM-tipVariable illumination spot size (ca. 2m 100m)Suitable for plane-wave illuminationSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution
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Near Field Moving Detector Goniophotometer
LSG-1900B
LSG-1900B Goniophotometer is near field Type C automatic goniophotometric instrument for luminous intensity distribution measurement. The LSG-1900B uses a constant temperature detector. It is for industrial laboratory photometric data measurements of small luminaires, such as down light, bulb light, etc.
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Near Field Probes
Anteral has extensive background in the design of Near Field Probes (open ended waveguides probes). Our Near Field Probes are currently being used in several laboratories around the world including the ESA's anechoic chamber. Anteral designs Near Field Probes from 10 GHz to 750 GHz covering the sectors requirements. Moreover, our Near Field Probes have a sharped design minimize reflections.
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Near Field Probes
A typical emi emission test is performed using broadband EMC antennas such as biconical, log periodics, Combilogs and horns. These antennas usually placed at 1, 3 or 10 meter distance as required by the test specification. These is considered far field measurements and the emission limits are given for the specific distance by the specification. During EMI compliance measurements, the emissions levels from products are compared with these limits. If the product exceeds these limits it is considered failing. These tests are typically conducted in a open area test site IOATS) or inside an anechoic chamber.
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Near-Field Scanning Optical Microscope Platform
MoScan-F
MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
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NF-Series Angle And Auto Reverse Models
The E-DRIV® NF-Series angle and auto reverse models is designed for installing heli-coil screw thread inserts, as well as light tapping and gauging applications. The assembly power tools feature the brushless motor technology and is engineered for precision torque control. These installation tools feature the ability to set and adjust the speed, the rotation (number of turns), as well as program an auto reverse function. Using the assembly tool in conjunction with a torque arm enhances the installation process. The electric screwdriver offers an adjustable speed setting. The NF power tool is ESD certified, ensuring less than 1 Ohm at the bit tip. ESD management assures product quality, cost savings and a reduction in overall ESD failures.
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Open Circuit Locator
A994
The A994 is an open circuit locator for electric and telephone cables wind on the reel; it gives the position of the fault from the inside or outside end of the cable, in percentage to the total cable length. The instrument measures the ratio of the capacitances of the two sections of failed conductor using two high precision i/v converters. The advantage of this method is due to the fact that the measurement error depends almost exclusively on the dimensional inhomogeneity of the cable. The A994 has the unique feature to permit the location of fault in cables with all broken wires. This instrument locates breaks in cables with a total capacity between 2 nF and 5 uF. The distance to fault is displayed on a large LCD display.
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Passive Magnetic Antennas, TX-Loop Antennas
A passive loop antenna which is matched to a resonance frequency of 13.56 MHz with 370 kHz bandwidth (-3dB)The purpose of the antenna is to produce defined magnetic fields at 13.56 MHz efficiently, i.e. to test near field communication devices (NFC) or RFID equipment.
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Preamplifier
Is designed for the amplification of measuring signals, e.g. weak signals of near field probes with high resolution.
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Scanning Magnetic Microscope
Circuit ScanTM 1000
Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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Scanning Near Field Optical Microscope
SNOM
SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
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Signal Generators
NF‘s function generators have been used in many applications, since NF produced the first Japan-built function generator in 1959.A function generator is general-purpose test equipment used to generate various waveforms and to execute trigger, sweep and gate oscillation.
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Zero Gauss Chamber
ZGC
The model ZGC zero gauss chamber reduces the environmental magnetic field (Earth field) to near zero inside the chamber. Any gaussmeter probe which is less than 9.4 mm or 0.370" diameter can be placed inside. The meter is then "zeroed", which means that it will read zero whenever the probe is subsequently placed in zero field. By using a zero gauss chamber, any offset error is therefore eliminated. The model ZGC is unique in that it contains a degausser (demagnetizer). This is situated between the inner and outer mu-metal shields. When the degauss button is pressed, any accidental magnetization of the chamber, no matter how strong, is erased. Accidental magnetization is a major problem with most zero gauss chambers and it has limited their use. If a magnet comes too close, the chamber will become "permanently" magnetized and will have an internal field that is typically 0.2 to 0.5 gauss. The chamber must then be degaussed because the Earth field is also around 0.5 gauss, so a magnetized zero gauss chamber will not significantly reduce the field.
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Near Field Probes 1GHz - 10 GHz
SX set
The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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Scanner Probe
RFS set
The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request RFS, LFS and XFS scanner probes can be produced.
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Near Field Probes 30 MHz up to 3 GHz
RF6 set
The RF6 near field probe set consists of 2 passive magnetic field probes and 2 passive E field probes for measurements in the development phase of the E-field and magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF6 set allow a step by step localization of interference sources of the RF magnetic field and RF-E-field on an assembly. From a larger distance the electromagnetic interference is detected by RF-R 50-1 for the magnetic field and by RF-E 02 for the E-field. The RF-B 3-2 and RF-E 10 probes with their higher resolution can more presicely detect the interference sources of the magnetic field and the E-field. Field orientation and field distribution on an electronic assembly can be detected by special guidiance of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Near Field Probes 30 MHz up to 3 GHz
RF1 set
The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Near Field Probes 30 MHz - 6 GHz
XF Family
The XF family consists of 4 passive magnetic field probes and 3 passive E field probes designed for measuring magnetic and E-fields in ranges from 30 MHz to 6 GHz during the development phase. Due to their integrated impendance matching the probes are less sensitive in the lower frequency range than the RF type probes.
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Fiber optic active antennas / field probes
EFS-105
The EFS-105 is the first in a family of fiber-optic active antennas & E-field probes. The field distortion caused by the probe head is nearly zero due to the exceptionally small probe head and the all-optical signal transmission and power supply. This gives an invaluable advantage for near field measurements and measurements close to metallic parts.
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EMC Near Field Probes
TBPS01
The TBPS01 EMC near field probes H20, H10, H5 and E5 are magnetic field (H) and electric field (E) probes for radiated emissions EMC pre-compliance measurements. The probes are used in the near field of sources of electromagnetic radiation.
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Near Field Microprobe E-field 7 MHz to 3 GHz
ICR E150
The near field microprobe is used to measure electric fields at extremely high resolution and sensitivity. The optimal distance to the object being measured is < 1 mm. Due to its small probe head dimension, the probe has to be moved by a manual or automatic positioning system, e.g. Langer-Scanner.
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Near Field Probes 30 MHz up to 6 GHz
XF1 set
The XF1 set of near field probes consists of 4 passive near field probes and one passive E field probe for making measurements in the development phase of the magnetic and electric fields in ranges from 30 MHz to 6 GHz. Due to their integrated impendance matching, the probes are less sensitive in the lower frequency range than the RF type probes. The probe heads of the XF1 set allow for the step by step identification of interference sources of the magnetic field on an electronic assembly. At first, for example the XF-R 400-1 detects the fields which the assembly emits in total. Next, using higher resolution probes the interference sources can be more precisely detected. The E field probe is used for the detection of electric interfering fields near the assemblies. With trained use of the near field probes, field orientation and field distribution can be detected. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
