- Pickering Interfaces Inc.
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PXI Precision Resistor Module 9-Channel, 1.5 to 6.97k
40-297-024
This 9-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Wafer Test
Automatic KLA wafer probers with tray-to-tray-wafer-handling are operated 24h a day and 7 days a week. Data retention bake/tests are done at wafer level
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In-Circuit Test
Test Coach has been delivering the highest quality in-circuit test programs since 1998. Our engineers have the education, experience and expertise needed to solve your most challenging test requirements. We partner with our customers to provide comprehensive test solutions, including consulting on: design for test, recommendations on the best hardware and software options to implement, test strategy, and long term planning for multi board projects. Our expertise allows us to really understand cu...show more -
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Emulate Test in simulation
STIL-VT
Emulate test patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test patterns. Reads the intermediate STIL format of tester patterns and creates a Verilog /VHDL simulation test bench. (A sub-set of Virtual tester solution)
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Test Equipment
Test Devices has developed the world’s most precise, accurate and efficient test solutions because the company employs very experienced and accomplished scientists and engineers. For almost 40 years Test Devices has developed and advanced the science of centrifugal, vibratory and thermal stress testing and measurement of rotational components – critical solutions engineers need to evaluate integrity and validate component parts.
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MANIA TEST PROBE
SERIES 76
ElectricalMAXIMUM CURRENT: 3 amps continuousat working travel, non - inductiveRESISTANCE: At 35 mA test current,50 mOHMS meanMaterial and FinishesPLUNGER: Heat treated berylliumcopper, FINISH: -2E / -2P Hard nickel plated-2D / -2E138 24 Kt gold plated,BARREL: Phosphor bronze, nickel platedSPRING: Stainless steel, silver platedPIN: Music wire, hard nickel plated
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Endurance Test Stands
Endurance test stands to validate the life expectancy often run 24/7. We therefore place great store on the reliability of imc test stands. Whether it be the mechanics, data acquisition or automation – everything has been designed for endurance operation.
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Semiconductor Test Hardware Solutions
A critical element of every semiconductor test solution is the interface between the device and ATE. The hardware team at Test Spectrum has produced thousands of successful test interface solutions for some of the most challenging semiconductor products on all major ATE platforms. Our in-house team of PCB design experts has an added advantage of direct access to our senior test engineering staff.
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Flying Probe Test
Producing the highest quality test programs since 2005, Test Coach is the proven specialist firm for flying probe test. Our in depth knowledge of SPEA systems and over 10 years of honed flying probe test techniques guarantees that our test programs offer the highest test coverage possible. As an In – Concert Partner with SPEA, we work closely with their team to keep at the forefront of new product innovations and technology, so that we can provide the latest advancements to our customers. In add...show more -
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Universal Test Machines
AMETEK Sensors, Test & Calibration
he single column test stands offer a wide range of materials testing possibilities no matter what your testing needs are. Use the force testing machines for compression testing (Push) and tensile testing (Pull), or to perform a wide variety of tests on the universal materials testing machines.
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MECHANICAL TEST FIXTURE KITS
TX-MT-100 SERES
Test-X MT-100 Series mechanical kits are an inexpensive solution for testing smaller printed circuit boards and other devices.The MT-100 Series features a 1/2" thick FR4 probe plate and a 3/8" thick Lexan top plate. Precision alignment is assured through tooling holes in both the probe and top plates. Units are available with a 2-1/2" pan or an upper head assembly
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Component Test Stands
As your specialist for measurement and testing technology, imc designs and manufactures test stands perfectly matching requirements for a complete range of components: whether for servomotors, pumps, brakes or valves – according to your wishes, imc component test stands can quickly and precisely test for perfect operation, verify lifetime, determine energy efficiency, and much more. Thanks to the modern software imc STUDIO, test objects can be tested for complex and wide-ranging scenarios.Test s...show more -
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Test Program Management
TP-M
TP-M utilizes TestInsight unique capability to read and analyze a whole test program from flow to every test pattern, timings, levels etc.
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In-Circuit Test System Calibrations
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Boundary Scan Test
Boundary Scan is a very useful tool for quick, low-cost, re-usable powered-up test of an assembly for basic functionality. Because a fixture with test probes is not required, it is possible to have a working test available within hours or days, rather than weeks. Designers can receive rapid feedback on their prototype boards with tests that can be used again during production testing, as well as for device programming. Given power, ground and Tap port signals, tests can be written to assess the performance of the boundary scan enabled parts on an assembly and other parts on the boundary scan chain.
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RF Shielded Test Enclosure, I/O Intensive Device Tests
JRE 1720
Like its other brothers in the JRE test line, it features rugged welded aluminum construction with superb RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble-free operation over its lifespan. A JRE exclusive, our triple door locking mechanism allows easy single handle door operation. Ventilation is standard with our JRE exclusive honeycomb style vents in enclosure rear and door.
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Test Connectors
A wide range of standard test Connectors that can fit many of your applications and services. We offer a ideal solution for your testing needs in automatic or manual mode.
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Mixed Signal Test Systems
MTS2010i
The MTS-2010i are a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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THRU HOLE BARE AND LOADED BOARD TEST PROBES
SERIES 93
ElectricalMAXIMUM CURRENT: 7 amps continuousat working travel, non-inductiveRESISTANCE: At 35 mA test current,35 mOHMS mean
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RF Shielded Test Enclosure
JRE 0814
Testing tall devices? The 0814 stands up to any test up to 18 GHz! Featuring a wide swing open door with durable latch handle, this enclosure finds wide use in the WiFi test environment. Two shielded vents provide excellent cooling and optional fan(s) are available for those hot products. Tough 'honeycomb' vents maintain shielding effectiveness throughout the frequency range. Featuring rugged welded aluminum construction, you can be assured of its tight RF shielding effectiveness.
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RF/Wireless Test Fixtures
Test‐Head Engineering develops and manufactures RF Test Fixtures which allow the testing of RF and Wireless modules and components.
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300mm Single Touchdown Burn-in and Test System
FOX-15
Up to 15 wafers at a time Known Good Die solution Lowers production cost
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Test Fixtures-Assemblies
Qmax Test Technologies Pvt. Ltd.
Test Clips are available for various types of DIP ICs like 8, 14, 16, 20, 24, 28, 40, 48 & 64. These can be supplied with or without connectors and cables for interfacing to Qmax Testers. Test Pins in the clips are gold plated and engineered for good contact with the Device Under Test. It is designed for long life and trouble free operation. For easy handling the clips are provided with metal covers.
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Railroad Test Sets
Triplett Test Equipment & Tools
Railroad Testers are designed to perform standard maintenance tasks (using Volts, Ohms, and Amps measurements) as well as specialized tasks requiring measurements on railroad coding equipment. The 2000 Series is compatible with older test technologies and offers test features not found on earlier test sets.
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Latch-on Test Fixtures
Latch-on Test Fixtures provide a convenient way for production personnel to quickly and reliably make electrical connections to a product for programming or final test. These custom fixtures eliminate the need to hand-wire products in order to power them up and communicate with them. Typical applications for latch-on test fixtures are metering devices, control panels, and any type of controls that connect via terminal strips.
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Motorized Test Stands
AMETEK Sensors, Test & Calibration
Our motorized test stands are optimized for production floor operation. They provide a constant test speed and require a force gauge to be integrated with the test stand.
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Primary Injection Test System
HAOMAI Electric Test Equipment Co., Ltd.
Primary injection testing is suitable for testing over-current trip relays attached to a circuit breaker.
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Rugged Field Test Set
MTS-207
The MTS-207 is a state-of-the-art portable PXI platform for field testing and data acquisition systems. Its proven architecture has been deployed worldwide on multiple programs including the MTS-206 Maverick Missile system flight line tester, the MTS-209 Common Armament Test Set, the AN/TSM-205B Hellfire System test Set, and many more. It combines the capabilities of the versatile and powerful PXI architecture in a compact, ultra-rugged, flightline qualified enclosure. The MTS-207 is ideal for test and data acquisition applications requiring operation under harsh environmental conditions including flightline, back-shop, or airborne applications.