- TEAM SOLUTIONS, INC.
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HandyScope HS6-DIFF With SafeGround: 1 GS/s, 250MHz BW, 4 Channel (256MS/ch), USB Differential Digital Storage Oscilloscope, Spectrum Analyzer, Voltmeter, Transient Recorder
HS6-DIFF-1000XMG-W5
- 1GS/s sampling and flexible resolution of 8-16 bit.- Four input channels up to 250 MHz analog bandwidth- Highly accurate 1 ppm time base- DC Accuracy of 0.25 % and 0.1 % typical- Very fast 200 MSamples per second USB streaming Data logger- Spectrum analyzer with 32 million bins- Optional SureConnect connection test on all channels- Up to 256 MSamples memory per channel
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Defect Isolation
*Traverse through the physical design to trace nets and vias down to the defect location*Utilizes industry standard LEF/DEF design files, scan-based test information, tester fail logs and diagnostic reports to determine and isolate the physical defect location*Enables the user to leverage their diagnostic experience to determine the root cause of the defect*Interactive layout viewer displays scan chains, mapped mismatches of scan cells, layers, nets and subnets with search capabilities(component...show more -
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Defect Inspection System
F30
The F30 System boasts a five-objective turret that enables the resolution-throughput flexibility required by today’s multi-process inspection applications. Equipped with an advanced productivity suite (waferless recipe creation, simultaneous FOUP, recipe server and tool matching), the F30 System redefines inspection cost of ownership expectations.
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Manufacturing Defects Analyzer (MDA)
TR518 SII DRAWER
*The DRAWER Type is the new Manufacturing Defect *Analyzer (MDA) platform.
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Defect Inspection
With over 20 years of experience in defect inspection, microelectronics manufacturers around the world partner with us to improve yield by performing high-speed, automated inspection and then transforming the defect data into actionable process control with powerful analytical software.
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Defect Inspection Systems
Candela® defect inspection systems detect and classify a wide range of critical defects on compound semiconductor substrates (GaN, GaAs, InP, sapphire, SiC, etc.) and hard disk drives, with high sensitivity at production throughputs.
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Luminescence Defect Inspection System
INSPECTRA® PL Series
This system uses luminescent images created using photoluminescence (PL) to perform high-speed, high-sensitivity automatic inspection for crystal defects, cracks, and luminescence defects which cannot be detected with conventional visible light surface inspection!
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Source Code Defect Analysis
TotalView® Debugger
Dynamic source code and memory debugging for C, C++ and Fortran applications. TotalView provides analytical displays of the state of your running program for efficient debugging of memory errors and leaks and diagnosis of subtle problems like deadlocks and race conditions.
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Defect Inspection System
NovusEdge
The NovusEdge System provides high sensitivity inspection for the edge and backside of bare unpatterned wafers for current and advanced nodes. Multiple modules can be configured on the same automation platform for increased throughput while maintaining a small footprint for an improved cost of ownership.
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Wafer Defect observing instrument
HS-WDI
Application■Semiconductor wafer■Solar wafer■Solar Cell■Thin-film Cell
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Logic Analyzer
GoLogicXL-36
Logic analyzers and oscilloscopes offering fast sample rates and large memory depths are required to debug and test modern electronics. The GoLogicXL captures a very large window of bus activity using sample depths up to 1 billion samples. 4 GHz sampling rates expose the finest details in your signals. 1 GHz Transitional sampling provides the optimum method to capture fast data bursts separated by seconds, minutes, or even hours of bus inactivity. The GoLogicXL State analysis can also synchronize with single-data-rate 300 MHz SDR clocks, and double-date-rate 250 MHz DDR clocks (500 MHz effective).
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Surface Defect Inspection System
Wafer for inspection of surface condition of specular flat substrate, glass substrate, others φ 100 ~ φ 300 compatible
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Manufacturing Defects Analyzer
eloZ1-400
The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the very latest generation, reliably detecting connection and assembly faults on printed circuit board assemblies. The eloZ1-400 is the compact version of the eloZ1. It is particularly suitable if there is only limited space to fit test appliances. The eloZ1-400 can also be used as a mobile test system.
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Solar EL Defect Detector
Jiangsu Keyland Laser Technology Co., Ltd.
Features: - Reveals invisible defects- Improves line yield prior to lamination- Improves quality and reliability of final product- Exceptional optical resolution in its class- Flexible system configuration for framed or unframed modules testing
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Auto Macro Wafer Defect Inspection
EagleView
EagleView automated macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer classification for semiconductor manufacturing. EagleView systems have inspected over 100 million semiconductor wafers worldwide. The EagleView macro defect inspection tool resolves many of the problems and pitfalls of manual and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating complete imag...show more -
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Manufacturing Defects Analyzer
406A
The 406A is designed to target the highest number of assembly failures for the least amount of capital equipment cost, programming time, and maintenance costs. The precision Stimulus Measurement Unit provides AC/DC analog measurements that are accurate, stable, repeatable, and reliable.
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Sapphire Defect Laser Probe and Glasses
LP-100
Easy to use and portable■ low price with long lifetime■ can be used to detect many defects, like micro crack, bubbles, impurity, crystal subgrain■ When the laser go though the crystal, if it is monocrystal the light should be scattering, in macro it should be white.
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Analyzers
Birds' line of Handheld RF Analyzers are rugged solutions for your field analysis needs. Ranging from the multi-functional SignalHawk Series and Spectrum Analyzers, to the SA Series, 25-6000 MHz Site Analyzers - a user-friendly test solution for installing, maintaining, and troubleshooting your antenna and cable systems, to the AT Series, Antenna Testers which provide a cost-effective, fast, graphical way of determining the quality of mobile and base station antennas.
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Defect Inspection Module
EB40
The Class 1 certified E40 and B40 modules (available separately or combined in one module) can automatically detect defects on the entire edge, from zone 1 to 5, and the entire backside. The ability to inspect the entire backside allows for faster root-cause analysis of zone 5 defects since such defects can migrate from the wafer interior.
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Pipeline Defect Mapper
The non-intrusive measuring device takes measurements along the pipeline and plots the results directly onto the screen of the receiver. There is no need to carry extra logging and display devices. All the data is displayed and logged into the receiver for downloading to a spreadsheet or dedicated analysis program.
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Bus Analyzer / Protocol Analyzer
EZ-TAP™ PRO RS-232
Stratus Engineering’s EZ-Tap Pro hardware module RS232 sniffer is a sophisticated protocol analyzer and bus analyzer hardware solution that overcomes latency and time-tagging problems associated with traditional dual COM port monitoring solutions.
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Manufacturing Defects Analyzer
eloZ1-1600
The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the very latest generation, reliably detecting connection and assembly faults on printed circuit board assemblies. The eloZ1 can be integrated into table systems as well as into inline-systems.
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Impedance Analyzers
Sciospec stands for Electrical Impedance at its Best. Electrical Impedance Spectroscopy has been our core technology ever since. In the past years we have developed a scalable and flexible technology plaform that allows for precise, customizable, yet cost-effective lab-bench impedance analyzers. Choose between our three standard instruments, add some powerful options and enjoy an impedance analyzer that perfectly fits for your application.
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Thermomechanical Analyzer
TMA 450
TA Instruments invites you to experience the finest in Thermomechanical Analyzers, the Discovery TMA 450. Discover the advanced engineering and attention to detail that provides enhancements in every aspect of performance and a new level of user experience. Featuring advanced testing capabilities and the widest range of fixtures, the Discovery TMA 450 is sure to meet and exceed your expectations. It’s never been easier to get great TMA data!
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Power Analyzers
The N4L Power Analyzer range utilises the latest signal processing technology. Providing fast, accurate and repeatable measurement in the most demanding of applications. Whether you need to measure the efficiency of a variable speed motor drive or the losses in a transformer, N4L have a power analyzer measurement solution for you. We’ve combined years of experience in high frequency measurement instrumentation with innovative developments in analog and digital design techniques to produce a new ...show more -
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Thermogravimetric Analyzer
TGA801
The TGA801 is the latest generation of automated macro thermogravimetric analyzers to enter our lineup. The TGA801 maintains the core capabilities and reliability of previous generations of LECO macro TGA instruments, while providing key improvements in performance and robustness. By incorporating state-of-the-art hardware with an on-board touch-screen software platform and a rugged design, the TGA801 provides accurate, high-precision thermogravimetric constituent analysis—moisture, ash, volatil...show more -
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Mineral Analyzer
TerraSpec 4 Standard-Res
Analytical Spectral Devices, Inc.
Increase efficiency and optimize metal yield with high-throughput mineralogical analysis, and enjoy even greater data quality with the new TerraSpec 4 Standard-Res mining analyzer. Top mine operations around the world already trust ASD's TerraSpec line of mining instruments for their critical mineral analysis measurements.
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Spectrum Analyzer
FSC
The R&S®FSC is a compact, cost-efficient solution that offers all essential features of a professional spectrum analyzer with Rohde & Schwarz quality. It covers a wide range of applications from simple development tasks to production, or can be used for training RF professionals. Moreover, it is ideal for applicationsin service or maintenance. The R&S®FSC features a wealth of functions for simplifying and speeding up the development and testing of RF products
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Cheese Analyzer
DairyScan
The DairyScan allows for fast and accurate fat and moisture testing within your cheese production. Forget about slow, labour-intensive traditional testing methods and enjoy rapid analysis whenever you need it. Instant information helps you to spot out-of-spec products so that you can improve quality, avoid costly mistakes in production and ensure higher profitability. With a testing time of 45 seconds the DairyScan is ideal for smaller dairies producing less than 7000 tons cheese per year.
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Spectrum Analyzers
Frequency range:0.15∼500MHz(SA5005/SA5006T) 0.15~1050MHz(SA5010/SA5011T).Amplitude range:-100~+13dBm.Tracking generator(SA5006/SA5011T).Output level range:-50~+1dBm(in 10dB steps and var.)
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Power Analyzer
2105
The model 2105 provides accurate, reliable, & low-cost power measurement that enables engineering, production test, and quality assurance departments determine precise product power consumption from DC and AC power sources.
