- Virginia Panel Corporation
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Module Accessory Kit, Quantity 26, 4-40 x .50" Socket Head Cap Screws Stainless Steel
510109495
Used with modules: 510108240.
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Laser Head
5517CL
The Keysight 5517CL is used primarily in VME and PC based laser interferometer systems where the velocity of motion is faster, such as semiconductor lithography and flat panel applications. Option 009 allows a larger angular range of measurement by providing a 9 mm beam diameter for use with three-axis interferometers. Please contact Keysight for custom requirements.
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Laser Head
5517FL
The Keysight 5517FL is used primarily in VME and PC based laser interferometer systems where the velocity of motion is faster, such as semiconductor lithography and flat panel applications. Please contact Keysight for custom requirements.
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HEAD artificial head microphones
HSU III
The HEAD-Shoulder-Unit HSU III is an artificial head microphone for binaural recordings.
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Test Contactor/Probe Head
Mercury
Mercury™ test probes and contactors are excellent spring probes for the laboratory though they were designed with the robust qualities needed for high-volume production test. Their unique design ensures excellent plating quality for low, consistent resistance, long life, and high-test yields.Mercury probes are available with minimum pitches of 0.3 mm, 0.4 mm, 0.5 mm, and 0.8 mm, to provide the best performance at any device pitch. Mercury probes have bandwidths of up to 22 GHz, and can carry over 3 Amps of current. The Mercury is an excellent choice for any test application.
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Test Contactor/Probe Head
cBoa
cBoa™ test contactors and probe heads are the solutions for contacting high-frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C and bandwidth of up to 35 GHz @ -1 dB.
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Test Contactor/Probe Head
Hydra
Engineered for excellence and efficiency, Hydra™ spring probe series offers precision, reliability, and standardized semiconductor test interface.Designed to be best-in-class at a competitive price point, Hydra is optimized to maximize your operational efficiency. Hydra is built to withstand demanding high-volume manufacturing test environments with its robust and durable design.With a common test-height, Hydra offers the ability to mix and match power, RF, and Kelvin probes within the same test socket. In addition, Hydra streamlines inventory management with fewer probe part numbers to manage and shorter lead times.
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Laser Head
5517D
The Keysight 5517D is used primarily in VME and PC based laser interferometer systems where the velocity of motion is faster, such as semiconductor lithography and flat panel applications. Please contact Keysight for custom requirements.
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Erase Magnetic Recording Heads
International Electro-Magnetics, Inc.
*Dual Gap Ferrite Cores*Cassette - 2" Formats*MultiTrack Interlace*Full Track 1" Video
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Impulse Hammers/Impedance Heads
Impulse hammer excite from the smallest of structures to various civil engineering structures. The Dytran model 5800SL is an ultra miniature IEPE impulse hammer used to excite structures or machinery with a definable impulse force in modal and structural analysis of very light structures and impulse testing of very low mass, high resonant frequency components.
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chromatic Confocal Sensor Heads
ENDO
Sciences et Techniques Industrielles de la Lumière
STIL introduces ENDO series, a new range of chromatic confocal sensor heads with an exceptionally small size.With a mechanical diameter from 4 to 8 millimeters and a straight or radial beam of 90°, ENDO series is ideal for non-contact measurement applications in reduced space environments.
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Laser Head
5517C
The Keysight 5517C is used primarily in VME and PC based laser interferometer systems where the velocity of motion is faster, such as semiconductor lithography and flat panel applications. Option 009 allows a larger angular range of measurement by providing a 9 mm beam diameter for use with three-axis interferometers. Please contact Keysight for custom requirements.
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Test Contactor/WLCSP Probe Head
ACE
ACE™ test sockets offer optimal RF performance for fine pitch FBGA, QFN and wafer-level packages for Power Amplifiers, RF switches and mobile communications. Supporting pitches down to 0.4 mm, ACE features an innovative design that provides superior performance, improved yields and power efficiency.ACE probe heads deliver exceptional electrical performance, both DC and RF. Manufactured from HyperCore™ base material, a proprietary material of Cohu’s Everett Charles Technologies, ACE probes have t...show more -
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Industrial Temperature Head Sensors
A selection of Head Mounted Industrial Temperature Sensors for many applications with RTD / PRT varieties, Hygienic and Heavy Duty probes.
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TrainLink™ Head Of Train Device
Wabtec Trainlink telemetry systems provide a critical link to last-car information, such as brake pipe pressure, motion status, battery condition, and high visibility marker status.
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Head Expanders
By increasing the mounting area of the shaker, multiple items can be tested at the same time, decreasing total test cycle time. In addition, with Guided Head Expanders, payloads with large foot prints can be safely mounted and tested on the shaker, minimizing the risk of damage to the shaker suspension system. Although many head expanders are resonant below 1000 Hz, average or extremal control allows operation to 2000 Hz.
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IQ4 Rectangular Search Head
The IQ4 Rectangular Search Head Metal Detector is designed to be integrated within production lines or conveyor systems.
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Wafer Probe Heads
WLCSP test is the applying final test conditions at Wafer Level. WLCSP testing is driven in lowering the cost of test of devices through economical methods of manufacturing and testing.
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Laser Head
5517A
The Keysight 5517A is used primarily in VME and PC based laser interferometer systems where the velocity of motion is slower, such as machine tool applications. Please contact Keysight for custom requirements.
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Artificial Head & Binaural Recording
With binaural recording systems, you can record sounds true to reality, as if you were in the sound field yourself. Our variety of artificial heads accurately reproduce all acoustically relevant components. Ear simulators with different microphones enable aurally accurate recordings, while mouth simulators allow speech playback in the transmitting direction when voice and audio quality are tested in the laboratory.
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Probes With Industrial Heads
Used in industrial applications for process temperature measurement, these probes come in a variety of protection head styles for easy connection wiring to your extension cable
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Laser Head Cable, 20 m
10881C
Provide reliable power with this five-pin female DIN that connects the laser head to multiple laser boards.
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Doppler Sensor Heads
Designed for long range motion/speed/directional detection where the sensitivity is essential.
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Attitude Heading Reference System
(AHRS) TRAX2
Using its unrivaled magnetic sensor expertise , PNI fuses its proprietary magnetic sensors and sensor fusion algorithms, delivering accurate AHRS heading without the need for GPS.
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Test Contactor/Probe Head
Atlas
QuadTech™ probe solution with cruciform tip strength that stands up to lateral force without bending, plus an enhanced compliance window to accommodate package stack height tolerance.Atlas™ test contactor offers electrical performance that allows the customer to test to the true performance of the device. Atlas WLCSP test contactors achieve mechanical reliability with a rigid “cruciform” tip applied to Cohu’s QuadTech flat probe technology. The Atlas offers a short electrical path, with lower capacitance and inductance, that is ideal for functional and AC parametric testing of WLCSP devices that require high system bandwidth and throughput gains in large multisite test applications.
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Motorised and Automated Probe Heads
Motorised heads enable automated, repeatable re-orientation of probes to allow access to features on all faces of the part, improving the capability of the CMM and maximising productivity.
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Test Contactor/Probe HEad
cRacer
The cRacer™ test contactor and probe head portfolio offer solutions for 5G mmWave FR2 up to 54+ GHz.cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 100 µm to 650 µm, covering the majority of 5G devices.cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
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Square Head Fiber
Panasonic Industrial Devices Sales Company of America
Panasonic Square Head Type Fibers are compact and allow for right angle, space-saving installation, with minimum pitch using needle-nose pliers. These Fibers are also lens compatible for longer detection.
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Laser Head Cable, 3 m
10881D
Provide reliable power with this spade lug that connects the laser head to multiple laser boards.
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Single Head Component Testers
34XX
Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Exciter Head
The Exciter Head, with its force and displacement transducers, generates and measures the force or torque to the structure being tested and provides feedback signals for control of the test variables.
