- Pickering Interfaces Inc.
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Dual 2 Channel Fibre Optic Mux FC/PC
40-815-122
Pickering PXI Fiber Optic Multiplexers connect a single channel to one of two or four channels. They are available in single or dual multiplexer configurations supporting single-mode or multi-mode fiber. A wide choice of connectors types is available. The 40-810 multiplexer connects the optical channel by redirecting the optical signal into a selected output fiber.
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Mixed Signal Test Systems
MTS2010i
The MTS-2010i are a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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Function Test Systems
These specialist Automeg models test the function and integrity of wiring harnesses combined with active components such as relays, switches, contactors, diodes, LEDS, actuators and other active components.Our software takes the complex and traditionally long task of creating functional tests away from the test engineer and allows these to be created automatically, from existing ECAD data and our component library and automated software routines. All the different routes and subtests are automatically calculated in seconds.
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Pressure Decay Test Systems
Pressure decay leak testing technology has become a mainstay in the arena of high volume production testing. Pressure decay testing methods offer the world's manufacturers a cost-effective and easily applicable solution to the leak testing challenges they encounter on a given day. Fundamentally, pressure decay testing is a straightforward measurement technique; Cincinnati Test Systems (CTS) pioneers new and innovative ways to integrate our technology into custom turnkey systems that exceed the i...show more -
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TRIO Test System
*ICT FCT LED *Perfect & Cost Effective Technical Solution for Electronics manufacturers
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Vector Signal Generator
VSG25A
The VSG25A is a 100 MHz to 2.5 GHz vector signal generator, featuring a 12-bit I/Q baseband arbitrary waveform generator which can be clocked at virtually any frequency from 54 kHz to 180 MHz, and includes a 4096×16 bit pattern buffer for built-in or custom modulation.
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Automotive EMC Test System
The specific EMC requirements in automotive tests take continuously, so that the test waveforms are becoming increasingly complex. As a manufacturer of EMC test simulators and due to the participation in international standardization bodies Hilo test knows the current and future requirements of the automotive industry exactly. The following automotive products are specifically geared to the current EMC requirements in modern automobile, and described in the standards ISO 7637 and ISO 16750.
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Custom Test Systems
ATE Systems has developed a wide variety of custom test systems that integrate commercial test instruments and custom hardware, tied together with a test executive. Examples of the types of tests that have been incorporated include: S-parameters (gain, return loss, VSWR, etc), Noise figure, Power, Spectral response, Linearity, Voltage, Current, Switching speed and so on
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Modular Test System
DMT
The DMT Tester is a modular test system that allows rapid measurement of electrical and non-electrical parameters of functional units. The system also allows basic ICT measurement with optional accessories. It is conceived as modular, with the possibility of integrating a wide range of own and external instruments. The DMT tester is controlled by its own SCADUS software.
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300mm Single Touchdown Burn-in and Test System
FOX-15
Up to 15 wafers at a time Known Good Die solution Lowers production cost
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Seven-Module Test Set
F8300
Use the F8300 for testing three-phase conventional schemes and digital protection systems. This seven-module F8000-series instrument is available in five standard configurations of HVA Current, HVA Voltage, and Low-Density Logic I/O modules.
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Ionic Contamination Test System
Omegameter SMD 650
The SCS Omegameter SMD 650, the long-time industry standard for ionic testing utilizing “static test” methodology, is designed to perform cleanliness testing on printed circuits and assemblies. Identifies the presence of ionic contamination on bare and assembled printed circuit boards and other electronic components. Provides an accurate and repeatable method for determining cleanliness on site. Provides immediate process control results, eliminating the need for outside laboratory testing.
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Build-to-Print for Test Systems
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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Automated Test Systems
Chroma Systems Solutions, Inc.
From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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Standard Test Systems
WaveCore™ Products
Textron Systems’ WaveCore family offers a variety of standard test systems with a primary application of satellite payload lab testing. Our systems can be deployed affordably for both production and engineering applications, providing industry-leading levels of data correlation with high system mean time between failures and low mean time to repair.
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Mixed Signal Test Systems
MTS1000i
The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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Vacuum Leak Test Systems
Vacuum leak testing is the principal leak test method for testing parts that could have leakage from an external source into their housings and casings. Parts like underwater sensors or housings, outdoor electrical housings, sealed components, and components associated with vacuum sources are all prime candidates for vacuum leak testing. Operation of instruments that supply vacuum to test parts instead of pressure works in a similar, yet essentially opposite, manner as pressure decay testing.
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Defined CRPA Test System
BroadSim Wavefront Software
Protecting your GNSS systems from jamming and spoofing is more critical now than ever before. BroadSim Wavefront was designed to enable easier and more affordable CRPA receiver testing, leveraging proven software-defined architecture.
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Four-module test set
F8200
Use the F8200 Power System Simulator for testing single-phase conventional schemes, digital protection systems, and more. This four-module F8000-series instrument is available in four standard configurations of HVA Current, HVA Voltage, and Low-Density Logic I/O modules.
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Full Wafer Contact Test System
Fox 1
Unique cartridge technology uses full-wafer contactors combined with parallel test electronics to achieve single touch, full-wafer test
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Induced Signals Test
The test relates to interfering signals that may be generated by interconnected equipment. Induced signal testing is used to determine if equipment will withstand various signals, such as might be introduced by failures in other equipment to which the test unit is connected.
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Manufacturing Test Only System
MTO
The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
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Modular Test System
A modular test system, RTS (real time scanner) provides instant test results with minimal interface cables to check wiring during installation.It tests wire harnesses in real time using our micro switching technology, reducing the need for high cost interface cables by around 90%. an innovative best-in-class solution for FAL testing, RTS also offers many benefits for wire harness and sub-assembly manufacturers.
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Wireless Test Fixtures
At Forwessun, we have vast experience in designing and delivering wireless in-circuit test (ICT) fixtures. We have experience in providing fixtures tailored to the unique needs of various different industries. While our primary customer focus has been on full and half-bank fixtures for the HP3070 system, we offer bespoke solutions for other platforms as well including GenRad, Teradyne, and SPEA systems.
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Compact EMC Test System
Multi-CE5
The Multi-CE5 includes an Electrical Fast Transient Generator (EFTG), a Combination Wave Generator (CWG) and a Coupling-/Decoupling Network (CDN) for single-phase power supply lines. The software program CE-REMOTE allows full remote control of the test generator via Ethernet light guide as well as recording, evaluation and documentation of test results, according to IEC 17025. To record the wave shape of impulses, it is equipped with an Impulse Recording Function (IRF).
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Mixed signal LSI test system
Multi-pin type model is now launched in WL27 Logic/Power mixed LSI test system.This system is suitable for multi-site test in A/D mixed device such as automotive・motor driver IC. It’s a high throughput and cost performance mixed signal LSI test system.
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Circuit Breaker Test System
AutoScan
AutoScan Circuit Breaker Test System is used for performing routine tests on circuit breakers and various other types of switchgear. This test system is designed to test vacuum circuit breakers, high voltage circuit breakers, and extra high voltage circuit breakers as per suitable standards.
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Test Systems
6TL’s speciality is simplifying the architecture of test systems, so that our customer’s Total Cost Of Ownership is drastically minimized. The technology that conveys our mission is called FastATE.FastATE technology is based on using intelligent modules to build test systems.
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Test Systems Inspection Systems
Different requirements demand flexibility. ELABO boasts a modular product portfolio permitting the economical creation of bespoke solutions for every client. These solutions range from individual testing devices through tabletop workstations with integrated testing equipment all the way to automated systems with ERP connections for mass production.
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Circuit Breaker Endurance Test System
Endurance testing involves operating – closing and opening – the circuit breaker repeatedly for a set number of cycles. This test is necessary to stabilize the circuit breaker mechanism and to identify “Early Infant Mortality” failures in the switchgear assembly.