Filter Results By:
Products
Applications
Manufacturers
-
product
Contactless Wafer Geometry Gauge
MX 20x series
The E+H geometry gauges are based on two heavy plates mounted parallel to each other. Embedded in the plate are a set of capacitive distance sensors. The wafer will be moved manual or automatically between the plates and measured without any movement.
-
product
Correlation Analysis
EDM Modal Correlation Analysis allows the user to correlate two modal models; EMA and/or FEA models. Comparing the experimental data with that acquired through finite element analysis helps in validating the test results. Users can import the geometry model and mode shape data from FEA or EMA software. A modal mapping procedure is executed to match the EMA and FEA models. After this matching procedure, the new mode shape information from FEA is interpolated and the FEA modal parameters are displayed alongside with EMA results. Finally, to observe the correlation between the results from the two methods, a Cross-MAC matrix is calculated and shown.
-
product
DC Resistance or Conductance of Insulating Materials
ASTM D257
These test methods cover direct-current procedures for the measurement of dc insulation resistance,volume resistance, and surface resistance. From such measurements and the geometric dimensions of specimen and electrodes, both volume and surface resistivity of electrical insulating materials can be calculated, as well as the corresponding conductances and conductivities. These test methods are not suitable for use in measuring the electrical resistance/conductance of moderately conductive materials. Use Test Method D4496 to evaluate such materials. This standard describes several general alternative methodologies for measuring resistance (or conductance). Specific materials can be tested most appropriately by using standard ASTM test methods applicable to the specific material that define both voltage stress limits and finite electrification times as well as specimen configuration and electrode geometry. These individual specific test methodologies would be better able to define the precision and bias for the determination.
-
product
Digital Automated Fiber & Ferrule Interferometer For Single Fiber Connectors
DAFFI SF
The latest interferometer from Data-Pixel is a cost effective solution for high volumes production, without compromising on accuracy or performance. Based on our extensive interferometer manufacturing experience we designed the DAFFI SF to be robust, fast and accurate in order to meet all manufacturing or laboratory environments. With the Blink software platform, DAFFI is able to measure the end face geometry on single fiber connectors in a very short time. The Daffi interferometer accessories (flange and adapters) are fully compatible with the Daisi range, allowing the user to limit the costs of the 3D geometry measurement units.
-
product
Digital Automated Interferometer and Microscope for Surface Inspection
DAISI-V3
The ultimate production interferometer for measuring end-face geometry on single-fiber connectors, equipped with a revolutionary «no-exterior-moving-parts» mechanical design.
-
product
Entry-level Price Interferometer for Geometry Measurement of Single Fibers
3D SCOPE-V2
Specifically designed for use in a production environment, 3D Scope-V2 is a robust, compact and easy to use interferometer that brings speed and precision to operators. 3D Scope-V2 supports our Blink software platform. Non-compressed, real time and high quality images are transfered from the hardware to the software via a USB 2.0 link in addition to the automation and control commands.
-
product
Human Radiation Spectrometers
Human radiation spectrometer is designed for express control and measurement of the activity of 137 Cs and 134 Cs gamma-emitting radionuclides in the human body, as well as for assessing the internal radiation dose (“sitting in a chair” geometry).
-
product
HyMPulse Pulsed Field Magnetometer
Metis Instruments & Equipment NV
Geometry independent M-measurement (patent pending): One probe fits all, no pole shoes per magnet geometry. Measure the actual magnet instead of a prepared standard size sample. Measurement of industrial shapes like segments, cylinders, bricks,... with one probe
-
product
Integrating Sphere Solutions
An integrating sphere is a light collector which takes advantage of physical geometry to homogenize any radiation being emitted inside by relying on a high-reflectance coating material. Depending on the wavelength range the end user using a sphere with, different coatings have different advantages based on the application.
-
product
Interferometers
Sumix interferometers are designed for inspection of fiber optic ferrules, patch cords, pigtails and bare fiber in the process of polishing and assembly. They enable you to check polishing quality, test connector end face geometry per IEC, Telcordia or your own custom standards and generate reports to supply with your patch cords.
-
product
MPO/MTP Multi-Fiber Interferometer
Anfkom International Co.,Limited
It is an automatic and non contact fiber endface interferometer for both multi fiber and single fiber connectors. It can measure the geometry parameters of multi fiber connector such as fiber height,core dip, X and Y angel, radius of curvature with white light and measure geometry parameters of single fiber connector with red light. The software can display the surface of the connector in 3D image for a very short time, it need only 8s to test 12-core MT connector. It is intelligent , efficient,stable and accurate and very helpful in improving the quality of the product.
-
product
Multiphysics Simulator
The COMSOL Multiphysics simulation environment facilitatesall steps in the modeling process defining your geometry, specifying your physics, meshing, solving and then post-processing your results. Model set up is quick, thanks to a number of predefined modeling interfaces for applications ranging from fluid flow and heat transfer to structural mechanics and electromagnetic analyses.
-
product
NTSC Standard Pattern Generator
PG315N
The MicroImage PG315 pattern generator is designed for simple size and geometry reference applications. The PG315 will overlay one of five standard patterns including a centered cross line, a centered cross hair, a centered target style symbol, a dot grid (cross dot) array, a hatch grid (crosshatch) array.
-
product
PAL Standard Pattern Generator
PG315P
The MicroImage PG315 pattern generator is designed for simple size and geometry reference applications. The PG315 will overlay one of five standard patterns including a centered cross line, a centered cross hair, a centered target style symbol, a dot grid (cross dot) array, a hatch grid (crosshatch) array.
-
product
Plastic Optical Fiber Preform Analyzer
2600
The unique vertical design of the 2600 Preform Analyzer gives manufacturers of GIPOF the ability to perform completely automated analysis. Its' automated axial (longitudinal) and radial preform positioning facilitates rapid and precise analysis of the entire preform structure. From the acquired index profile, the 2600 is able to calculate geometry metrics such as preform core diameter, outside diameter and core/clad concentricity.
-
product
Portable Connector End Face Geometry Interferometer
Thorlabs’ Vytran® Connect-Chek® Interferometer automatically and precisely measures radius of curvature, apex offset of polish, and fiber undercut or protrusion on any PC or APC, single-fiber connector. The CC6000 interferometer uses a non-contact tilted-phase-analysis technique for fast, reliable measurements of connector end faces. This compact interferometer has a carrying handle and must be attached to a desktop or laptop computer (not included) with a standard USB 2.0 port for operation. The included CC6000 software, which is used to control the interferometer, can be installed on a computer with the minimum requirements in the table below. Designed for use in both the factory and the field, this interferometer provides crucial quality information needed to assure long-term performance of fiber optic connectors. One CC250P Mount for Ø2.50 mm PC Connectors and one RT250P Reference Tool for calibrating the CC250P mount are included with the CC6000 interferometer; mounts and reference tools that enable measurement of other PC or APC, single-fiber connectors are available separately below. When used with an appropriate mount for APC connectors, the CC6000 interferometer is also capable of measuring the APC angle and key error.
-
product
Rotating Machinery
Synchronize rotating machinery data with a corresponding RPM signal to understand the RPM-dependant vibrational behavior of your measurement object. The package includes Order Analysis for performance optimization of your rotating machinery. Create your structure's geometry with just a few clicks to animate the structure's vibration behaviour. This offers the very unique possibility of an Order Operating Deflection Shape (ODS) analysis.
-
product
Rotman Lens Designer
Rotman Lens Designer (RLD) is a software tool for the design, synthesis, and analysis of Rotman Lenses and their variants. It is based on Geometrical Optics combined with the classical Rotman Lens design equations. It is intended for rapid development and analysis of Rotman Lenses given several physical and electrical input parameters. RLD generates the proper lens contours, transmission line geometry, absorptive port (dummy port) geometry, provides an approximate analysis of performance, and generates geometry files for import into Remcom's XFdtd® for further analysis and fabrication.
-
product
SANA 2 Interferometer
CA3004
SANA 2 fiber endface interferometer is a type of cost-efficient non-contact test instrument with excellent performance. It is able to measure the fiber endface geometry parameters such as radius of curvature, apex offset, fbre height and polishing angle of APC connector.
-
product
SANA Mini Portable Interferometer
CA3005
CA3005 SANA mini is a portable, non contact fiber endface interferometer for single fiber connector. This interferometer has a high performance while the size of the instrument is incredible small. SANA mini need only a USB link to work without any external power supplies. It can test the geometry parameters of single fiber connectors such as radius of curvature, apex offset and fiber height. The data and report are generated in excel format and it is very helpful for management and analysis. SANA mini is a suitable interferometer for field usage.
-
product
Software to Simulate Large Area Semiconductor Devices
Laoss
Laoss is a powerful software to simulate large area semiconductor devices (OLED, thin-film PV), taking into account the voltage drop in the electrodes due to important resistive effects when the size of the device increases.Simulation of large area semiconductor devices (OLED, thin-film PV)Coupling law input: analytical or tabulated (experimental or simulated) IV curveDevice optimization (electrode material, device geometry etc...)High speed computation
-
product
Solar Wafer Geometry and Surface Inspector
7201
The Chroma 7201 was designed to measure wafer lengths, widths, diagonal, orthogonal and chamfer size and angle, it is also capable to detect surface stains. User friendly software and GUI enable versatile parameter setting and result, it also provides a defect display and storage function for further analysis or potential MES/CIM integration.
-
product
Standard Pattern Generator Board
BL-PG315-01
The MicroImage PG315 pattern generator is designed for simple size and geometry reference applications. The PG315 will overlay one of five standard patterns including a centered cross line, a centered cross hair, a centered target style symbol, a dot grid (cross dot) array, a hatch grid (crosshatch) array.
-
product
TDR Structural Health Monitoring
Material Sensing & Instrumentation
MSI Time-Domain-Reflectometry (TDR) Structural-Health Monitoring probes the structural health of a composite part by propagating a fast electrical pulse along a distributed linear sensor which has been fabricated directly in the laminate. The sensor is formed from the native graphite fibers already used in composite manufacture, and constitutes zero defect. Fibers are patterned into a microwave waveguide geometry, or transmission line, and interrogated by a rapid pulse as shown below. Structural faults along the line cause distortions in waveguide geometry, producing reflected pulses similar to radar. Cracking, delamination, disbonds, moisture penetration, marcelling, and strain are all detected by propagation delay, for sensor lengths up to several meters.
-
product
Vibration Analysis
The vibration analysis software WaveImage includes a full set of methods providing an accurate and detailed overview of your vibration measurement data. This gives you a clear understanding of the cause-and-effect relationships between specific excitations and their vibrational response. Create a simple geometry model of your structure and link your multi-channel measurement data to the points in the geometry where the data was recorded. Then visualize the dynamic deformation of the structure under specific operating conditions with a detailed animation.
-
product
Wafer Sorter and Inspection
SolarWIS Platform
Eliminating the opportunity for problematic wafers to enter cell manufacturing lines greatly improves output and yield. ASM AE’s wafer sorter features 3D area inspection capability to inspect wafer thickness, total thickness variation (TTV), saw marks, as well as wafer bow and warpage. SolarWIS also includes modules that can inspect for stain, geometry, micro-cracks, edge chips, resistivity, P or N conductivity and lifetime.
-
product
Wafer Thickness, TTV, Bow and Warpage
ALTO-TTV FAMILY OFFERS THE SPEEDY MEASUREMENT OF WAFER GEOMETRY PARAMETER, MORE IMPORTANTLY, WE CAN AUTOMATE THE TOOL TO HANDLE FROM THIN WAFERS TO PERFORATED, WARPED, BUMPED, AND TAPE-FRAMED WAFERS. OPTIONAL SORTER AND SHIPPING JAR UNPACKING FUNCTION AVAILABLE.
-
product
WATOM
Wafer edge and notch profile measurementThe use of smaller and smaller patterns in the semiconductor industry calls for increasingly advanced materials of extremely high quality. In response to the steady improvements in the quality of wafers, KoCoS Automation has developed WATOM, a wafer edge and notch profile measurement tool which heralds a new era of extremely precise wafer geometry measurement.WATOM supports quality assurance throughout the wafer manufacturing process, starting at the very beginning and continuing on through to wafer reclaim.The WATOM Edge and Notch Wafer Geometry Analyser sets the worldwide benchmark for the quality assurance of geometrical measurements in semiconductor wafer manufacturing, combining the highest quality standards with top-class service. These high-precision, laser-based edge profile measurement tools are specially designed for optimum integration in manufacturing lines within the semiconductor industry.
-
product
Fiber Interferometers
Wuhan Sunma Technology Co., Ltd.
SunmaFiber Interferometer is an automatic, non contact fiber endface interferometer for single fiber connector developed by SunmaFiber. It is designed to measure the geometry parameters of single fiber connector end-face. Equipped with auto focus and auto centering functions, SUNMA INTERFEROMETER is very accurate and stable, it can also test bare fiber and bare ferrule. It is very helpful in fiber connector manufacturing to increase the quality of the connectors.
-
product
Linear Strain Gauges
Linear Pattern Strain Gages are the most straightforward geometry of strain gauge, designed to indicate strain in only a single direction.
