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Far-Field
Antenna under test (AUT) measurements in the radiation zone (far zone).
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2D Far-Field Analysis of Infrared Emitters
VTC 2400
Instrument Systems Optische Messtechnik GmbH
The VTC 2400 is a high-resolution infrared-camera that was developed specially for 2D-far-field analysis of the radiant intensity distribution of VCSELs and IR emitters. The measurement system consists of a light-permeable screen and a monochrome camera specialized for measurements in the near infrared range.
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Far-Field Systems
Far-Field testing can be accomplished in either outdoor or indoor configurations. The most common far-field test ranges are outdoor facilities. In an outdoor far-field range, the test antenna is installed on the test positioner located on a tower, roof or platform outside the instrumentation control room.
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Antenna Measurement Chambers
Antenna measurement chambers can be utilized to make far-field antenna pattern measurements. These chambers are designed either in a rectangular or tapered configuration depending on the frequency range of interest. Rectangular Antenna Measurement Chambers, like the one shown above, are the most common type of Antenna Chamber. The chamber size is dependent on the frequency range and the quiet zone size required.
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Compact Range Systems
Compact range reflector-based systems offer users all the advantages of far-field configurations but with the convenience of environmental and security control. For indoor, far-field testing of a 3 foot diameter, 10 GHz antenna, the separation distance would need to be nearly 200 feet. A compact range can reduce this distance to under 20 feet. The ability to control temperature, eliminate wind deflections, avoid rain and snow as well as reduce maintenance costs are other day-to-day advantages of this product arrangement.
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CATR Benchtop Antenna Test System
ATS800B
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique benchtop CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Single Probe Scanning Probe Microscope
MultiView 2000
an advanced single probe scanning probe microscope enabling a variety of modes of AFM/SPM/NSOM imaging. Nanonics has designed The MultiView 2000TM for excellence in scanning probe microscopy while allowing for near-field and far-field optical NSOM/Raman/TERS imaging without perturbation. The Multiview 2000TM is the only commercially available instrument that offers both tip and sample scanning. This versatility is important for different operation modes where the user can now choose whether the sample or tip is static. The Multiview 2000TM further offers the most stable feedback mechanism available in the form of normal force feedback with tuning fork actuation.
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Near-field Chambers
Most antenna measurements need to be carried out in the far field; that is, the test antenna should be illuminated by a plane wave. Typically this is carried out by providing sufficient separation between the source and the AUT so the spherical wave approaches a plane-wave character.Near-Field chambers are an excellent alternative to traditional far-field ranges; testing that can be accomplished on a far-field range can be accomplished on a Near-Field test range. This method of testing allows an operator to employ an indoor anechoic test chamber at a reasonable cost and avoid the problems associated with weather and security concerns often encountered when using an outdoor test range.
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Services
Our FARFIELD NDT division work with customers and industrial partners to develop novel and custom solutions, and to provide advanced inspection services to our customers in the field. Our R&D group includes world-known experts in EMAT technology and other advanced techniques. The inspection services group provide advanced inspection services using guided waves and other advanced techniques.
