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Digital Power Meter
Digital Power Meter is designed for single-phase measurements of AC power signals and related parameters common to most electronic products. Instead of traditional analog measurement circuits, the 66200 uses state-of-the-art DSP digitizing technology.
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Digital Power Meter
66205
The 66205 is the 2nd generation of the 66200 series power meter designed specifically for single channel measurement. Its state of art design is capable of providing highly accurate power measurements to meet the requirements of IEC 62301/EN50564 standards. Functionality improvements of the 66205 increase power measurement capabilities to a wider range of applications. The Smart Range function is one of the most important new features added to the 66205 power meter. Smart Range allows the power integration mode to perform active power measurements with the measurement range in auto mode. Chroma’s proprietary design automatically selects the appropriate range, based on changes in sensed voltage and current, ensures the best accuracy when integrating the measurements over time. The 66205 provides 10 selectable current measurement ranges from 5mA up to 30A. External sensor options A662017~A662020 are available to increase the current measurement range. Six selectable voltage ranges are available up to 600V.
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Optical Power Meters
Fast monitoring of optical signal power from -60 to +10 dBm across 750 – 1700 nm wavelengths. The 1500 Series power meter offers logarithmic analog output which is ideal for active fiber alignment.
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Analog Optical Power Meter - PXI
Power 1500 Series
The Power 1500 Series analog power meter brings cost-effective test and measurement. The Power 1500 provides logarithmic analog output as well as a digital optical power meter for applications that require real-time feedback.
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Analog Optical Power Meter - MATRIQ
The Power 1500 Series analog power meter brings cost-effective test and measurement. The Power 1500 provides logarithmic analog output as well as a digital optical power meter for applications that require real-time feedback.
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Inline Optical Power Meter - PXI
Power 1600 Series
Quantifi Photonics’ Power 1600 Series inline optical power meters provides quick and accurate inline power monitoring.Seamlessly integrate the power meter into your new or existing PXI test setup and save space, lower your costs and improve testing efficiency.
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High-density Optical Power Meter.
Power-1410
Quantifi Photonics’ Power-1410 optical power meter provides fast monitoring of signal power from -60 to +10 dBm and broad wavelength range of 1250 to 1650 nm. It provides unrivalled channel density with up to 288 parallel channels in a single 1U rack-mountable instrument.
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Optical Power Meter - PXI
Power 1400 Series
The Power 1400 Series optical power meter provides fast monitoring of signal power from -60 to +10 dBm and broad wavelength range of 750 to 1700 nm. With a logarithmic amplifier, it avoids gain-jumps faced by multi-stage linear amplifier power meters.
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Optical Power Meter - MATRIQ
The Power 1400 Series optical power meter provides fast monitoring of signal power from -60 to +10 dBm and broad wavelength range of 750 to 1700 nm. With a logarithmic amplifier, it avoids gain-jumps faced by multi-stage linear amplifier power meters.
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Inline Optical Power Meter - MATRIQ
The Power 1600 Series optical power meter provides quick and accurate inline power monitoring from -50 dBm to +20 dBm with 1, 2 or 4 channels in a compact form factor.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Test Solutions
Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.
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Tactical Radio Test Set
CTS-6010
The CTS-6010 brings an entire test bench to your front lines. Enable your technicians to detect equipment faults and verify operational capabilities at the I- and O-levels, saving valuable diagnostic time and cost.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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SoC Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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Laser Diode Reliability Burn-In / Life-Test System
58602
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.