Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
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Electronics Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Functional Test
xUTS
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Functional Test Fixtures
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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RF Testing Platform for ATx05
AT118
The functional test of modern devices with wireless connectivity always requires RF isolated cameras, as the only way to have the parameters controlled and to guarantee operation under the specified conditions.
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2-Module ICT System, I317x Series 6
E9902G
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to ...show more -
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Sea Water Immersion Test Device
Guangdong Bell Experiment Equipment Co.,Ltd
Sea Water Immersion Test Device Relevant standards requirement:Test Object: Battery storage pack or system.The test object connects all the wiring harness, connector and other parts according to the whole vehicle connection mode. Select one of the following two methods to operate test at the room temperature.Immerse the test objects (in the direction of real vehicle assembling) into 3.5% NaCl solution (mass fraction, simulated under normal temperature water composition) for 2 hours. The water depth is to be sufficient to completely submerge the test objects.Test objects according to GB/T4208-2017 part 14.2.7 test method and test process.
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IEC60884 Fig38 Thermal Compression Test Device For Plug Testing
IEC60884 fig38
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 fig38 thermal compression test device for plug testingUsed to evaluate the pressure resistance of electrical accessories and wall mounted mounting boxes under heatStandard: GB2099.1-2008 Articles 24.19 and 25.4 and Figure 38, IEC60884-1 Figure 38, etc.
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RF Device Tester
RF ITS
Sterner's automated test management system, combined with integrated RF technology modules, provides full functionality, including: Apply power to the device under test (DUT). Read and write blocks of data to set up and validate product EEPROM using a hard-wired communications interface. Scan transmitting devices or traveller barcodes and write the information to the DUT (the "sign-up process"). Inject an RF signal of known frequency and power level to test receiver sensitivity.
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Thermal Conductivity Measuring Device
TCM1001
In recent years, there has been a demand for small and thin electronic products such as mobile devices, and printed circuit boards are shifting to thin, multi-layered, and even modularized printed circuit boards. effect of bonding materials, that is, the ability to easily conduct heat, is emphasized, and testing equipment that evaluates thermal conductivity is required .As a business of our company, we have mainly manufactured and sold test equipment for solder wettability tests and solder bondi...show more -
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Hipot Tests
The hipot test (high potential test) or dielectric withstand test, is used to determine the insulation and dielectric strength. It is carried out on modules, devices and systems of protection class I + II. In this test, the insulation of the test object is subjected to greater stress by the high voltage than in normal operation. It is determined whether the insulation of all current-carrying conductors, as well as the safety distance to the enclosure, is sufficient and complies with the legal re...show more -
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Test Fixtures-Assemblies
Qmax Test Technologies Pvt. Ltd.
Test Clips are available for various types of DIP ICs like 8, 14, 16, 20, 24, 28, 40, 48 & 64. These can be supplied with or without connectors and cables for interfacing to Qmax Testers. Test Pins in the clips are gold plated and engineered for good contact with the Device Under Test. It is designed for long life and trouble free operation. For easy handling the clips are provided with metal covers.
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Test Probe
Beijing KeHuan Century EMC Technology Co,.LTD
Is a physical device used to connect electronic test equipment to a device under test (DUT).
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Test Probes
A physical device used to connect electronic test equipment to a device under test (DUT).
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Test System
LB302
Computer Gesteuerte Systeme GmbH
The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The ‘device under test’ (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance.
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Private Cloud Device Hosting Management Solution
ZAPFARM
ZAPFARM is a private cloud device hosting management solution that allows organizations to manage mobile devices and conventional workstations under test to offer their testing and development teams to manage applications under test and test cycles for Cross-Platform/cross-environment applications development and testing remotely.
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Acoustic Test Chambers
Small Device Test Chambers are used for >Basic sound level measurement of small products and equipment >Pre-compliance testing of small products and equipment >End of line manufacturing test on small products and equipment Small Device Test Chambers provide acoustic isolation from outside sounds and/or reduce the sounds from the device under test radiating into the host
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Automated Test Interface
ATI-100
Matrix Test Equipment Incorporated
Now, with our ?New? Model ATI-100 you can turn your existing Matrix Signal Generator and Switchable Filter Bank into a full-blown DTS (Distortion Test System). Plug and play is the word, just plug in your Multiple Frequency Signal Generator, Switchable Filter Bank, Spectrum Analyzer, Oscilloscope, Power Meter, Frequency Counter, etc. to allow the following automatic testing with a single insertion of DUT (device under test
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Customized Test Fixtures
Test fixture is a device designed to mount a device under test (DUT), equipment under test (EUT) and unit under test (UUT) in place and allow it to be tested by being subjected to controlled electronic test signals and procedures.
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EMC Test Systems
The sum of EMC is not necessarily equal to its parts; any modular electronic device from a complete aircraft down to a mobile phone needs to meet EMC requirements for the device itself, even if all the individual modules are compliant. For the enormous range of types of modular device requiring EMC test, R&S offers extremely flexible and scalable EMC test systems; practically as modular as the devices under test.
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EMI Test Receiver
ESL
The R&S®ESL EMI test receiver combines two instruments in one, measuring EMC disturbances in accordance with the relevant standards and also serving as a full-featured spectrum analyzer for diverse lab applications. The combination of very good RF characteristics and all of the important functions needed for fast, precise measurement and evaluation of the EMC of a device under test in accordance with commercial standards is unmatched in this instrument class.
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HTOL Test Systems
Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.
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Interoperability And Field Tests
Interoperability and field tests are carried out to determine the behavior of a device under test in a qualified test environment or in connection with specially selected, qualified products. Our interoperability and field tests are based on many years of experience with wireless technologies and our close cooperation with the leading manufacturers and network operators in the telecommunications industry.
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JTAG Functional Test
JFT
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be trans...show more -
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Memory Test Software
Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
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Power-Switching Test System
High Voltage Switching Test System
The Accel-RF Power-Switching Test System is capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25A (on) at rates up to 1MHz switching frequency, dependent on voltage. By leveraging technology developed for the RF burn-in tray platform with new fast switching measurement techniques, this system can support testing of multiple devices under elevated temperature stimulus in a small physical area, and offers the flexibility to test both soft- and hard-switching applications. The Accel-RF Power-Switching System is the most flexible and accurate power switching platform available.
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Protection Test Set
CMC 850
The CMC 850 is a protection test set dedicated to IEC 61850. It focuses on the real-time communication methods GOOSE and Sampled Values to interface with the devices under test.
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Relay Test Set
RNT-5A
This is a portable testing kit in one unit, suitable for testing protective relay, over current relay, earth fault relay, protective device, circuit breaker, tripping coils etc.The set is designed for both laboratory and field use. TECHNICAL FEATURES: INPUT : 230 Volts, single phase, 50Hz. AC. OUTPUTS : : 1) Current Output: a) 0- 1Amp. At 6/60Volts. (Continuous duty). b) 0- 5 Amps. At 6/60 Volts. (Continuous duty). c) 0- 10 Amps. At 6/60 Volts. (Continuous duty). d) 0- 20 Amps. At 6 Volts. (for3...show more -
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Semiconductor Test System
IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
