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HDMI Camera
TrueChrome IIS
Fuzhou Tucsen Photonics Co.,Ltd
TrueChrome IIS automatically analyzes the acquired images andoptimizes the white balance, exposure time and saturation, to present perfect images. Whatever for bright field bio imaging or dark field birefringent crystal imaging, TrueChrome IISdelivers ideal images, barely needing any parameter adjustment.
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Imaging & Analysis
Microscopes offered by Buehler generally fall into the categories of stereo microscopes, upright microscopes, or inverted microscopes. Inverted microscopes are commonly referred to as metallurgical microscopes. Microscopes may offer episcopic (reflected light) observation, diascopic (transmitted light) observation, or both possibilities. Illumination may be delivered in bright field mode (BF) or dark field mode (DF), and several techniques such as differential interference contrast (DIC) and polarized light microscopy make use of the nature of light to reveal specific pieces of information when studying materials.
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Optical Microscopy
Rocky Mountain Laboratories, Inc.
Optical microscopy from 1X to 1000X is achieved with a variety of microscopes. Images can be formed in bright field, dark field, and differential interference contrast (DIC or ‘Nomarski’) modes. Optical microscopy anlaysis is often used before any other techniques to document samples. Color and morphology are important clues in materials identification.
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Flexible Leakage/Line Current Tester
RLM-10+
MULTI MEASURING INSTRUMENTS Co., Ltd.
●Low-pass filter equipped, it can be cut the noise which is over 150Hz frequency.●Even Coreless Coil but Least Influence from External Magnetic Field and Residual Current●Superior Flexible CT enables Leakage Current Measurement●Backlight Function useful for measurement in the dark place
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Astronomy Solutions
For more than 40 years, Thales has delivered high accuracy optics for ground-based Astronomy all around the world. These optics range from single, but challenging, unmounted optical components up to fully integrated opto-mechanical systems. Our design heritage and past experience in this field cover the design, manufacture and AIT activities of many optics and sub-assemblies used in Telescope instrumentation, such as focal plane assemblies as well as the direct production of telescope mirrors themselves. Several major achievements of Thales ground-based Astronomy products were the Optical wide field corrector for the Dark Energy Survey (lien), the Reference Body for future Deformable Secondary Mirror of the VLT (lien) and different challenging spectrograph optics (Collimator and Cameras) for different Observatories (lien). One advantage Thales has with this activity is that most part of the manufacturing steps involved (i.e. opto-mechanical design, milling/grinding, lightening, polishing and coating) are directly under our control in our own facility. Our current capabilities for the production of optics for ground-based Astronomy are from a few centimeters size up to 2 meters. Thanks to the continuous efforts in R& D and investments into new production machines, Thales is now ready for future industrial challenges including the optical production of some key elements of the E-ELT, GMT and TMT programs.
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Vision Metrology System
NGS 3500Z
This bench top lower cost, yet high performance system is designed for applications where defect detection and precisionmeasurements on wafers and other parts (up to 200 mm) are required. It is well suited for use as a dedicated productiontool or as a versatile process development system. It features a powerful set of automated as well as semi-automaticoptical/ video tools optimized for high accuracy, production throughput, and ease of use.This automated and versatile platform features a standard Nikon/ Olympus bright/ dark field microscope with optionalNomarski, and precise part staging. This system offers significant and unique advantages for dual production/ engineeringuse, and provides the perfect solution when both defect detection and dimensional metrology are required.
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High Sensitivity Dark Field Surface Inspection
LIGHTsPEED
High throughput• Nanometer scale sensitivity• Autofocus• Full haze characterization• Multisize capability• Pits / Particle distinction• High lifetime / low CoO solid state laser• Advanced Automatic Defect Classification
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Camera Module Tester
Evolusys Technologies Sdn. Bhd.
• Lens Focusing plus Far Field Sharpness Testing - CTF/MTF/SFR• Near Field Sharpness Testing - CTF/MTF/SFR• Flat Field Grey Image Testing - Optical center, Defect pixels, particles, blemish, shading, color shading, color ratio, SNR, etc.• Dark Field Image Testing - Hot pixels, dynamic range, SNR, etc.• Current Measurement - Active, standby
