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High Frequency Coaxial Analytical Probes
D-COAX offers four analytical probe models: HyPac model for package characterization, and two models, Omni and OmniJet, for board level characterization, and DP1.4mm differential, single-ended probe.
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Laser Diffraction Systems
Since the release of the 7991 in 1974, the first commercially available particle size analyzer, Microtrac has been at the forefront of Laser Diffraction technology. By continuously improving the instrument technology, Microtrac offers customers a robust portfolio of Laser Diffraction instruments that’s ideal for particle sizing and characterization.
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Microwave Cavity Characterization
Material Sensing & Instrumentation
Microwave cavity characterization complements TDR Dielectric Spectroscopy in low-loss materials, providing high-resolution permittivity and loss data at specific single frequencies. Since measurements do not change significantly with frequency in low-loss materials (Kramer-Kronig relation) cavity measurement at select frequencies provides a full characterization across the RF/microwave range.
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Probes
D-COAX offers four analytical probe models: HyPac model for package characterization, and two models, Omni and OmniJet, for board level characterization, and DP1.4mm diffenrential, single-ended probe.
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Surface Characterization Analyzer
3Flex
Micromeritics 3Flex Surface Characterization Analyzer is a fully automated, three-station instrument capable of high-performance physisorption, mesopore, micropore, and chemisorption analyses with superior accuracy, resolution, and data reduction. Each analysis station is upgradeable from mesopore to micropore with the option of designating one station for chemisorption analyses
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Test bench for Infrared Focal Plane Array detectors
BIRD
The BIRD bench enables characterization of any types of Infrared Focal Plane Array (IRFPA) detectors.
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Test Handler
M4872
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Nanomechanical Test Instruments for Microscopes
Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Antenna Characterization
Radiometrics Midwest Corporation
Radiometrics Open Area Test Site and 10 Meter Anechoic chamber provide ideal test sites for antenna characterization.
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Static Image Analysis System Particle Size
PSA300
The HORIBA PSA300 is a state of the art turn-key image analysis solution. Seamless integration of Clemex's powerful particle characterization software and an automated microscope with high-resolution camera creates an intuitive, easy-to-use imaging workstation. Addressing a need in the field of particle characterization, the PSA300 is a versatile particle size and particle shape analysis tool that can be used in a wide range of applications in the pharmaceutical industries and material science. It is a turn-key solution for labs that want to maintain an analytical microscopy environment with minimum intervention by the operator yet still yield maximum detail in the results.
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Bench & Characterization Boards
Engineer, Design, Fabricate & Assemble Custom Boards for:*Device Characterization and Verification*Bench Testing*Failure Analysis*General Laboratory Use
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Deep-Level Transient Spectroscopy System
FT 1030
The Deep-Level Transient Spectroscopy has grown up to a most powerful tool for semiconductor characterization with unbeaten sensitivity in trap concentration detection and high efficiancy in impurity parameter determination.
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Combination Measurement Workstation
WS500
The WS500 is a combination measurement workstation that incorporates several different measurement types that can be included in a single characterization sequence.
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Laser Diode Characterization Testing
The Yelo Laser Diode Characterization system performs automated characterization of a laser device. The system will allow the operator to load a single packaged Laser device into a TEC controlled fixture mount. Each test station (LIV, Spectrum, Far Field/Beam Divergence) will then automatically align with the Laser Device in a sequential order and perform the automated tests required of each station.
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Solar Photovoltaic
Scientific Computing International
Automated metrology system designed for rapid, reliable, and accurate characterization of nearly any unpatterned thin film.
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Membrane Conductivity Testing
Designed for membrane and separator characterization in a liquid environment. Measure resistance, conductivity, permeability, cross-over, and selectivity.
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Thermal Analysis
The TORC (Thermo-optical Oscillating Refraction Characterization) technique applies decades of know-how in optical instrumentation to thermal analysis in a novel and unique way. The technique requires minimal sample preparation at maximal tolerance for sample properties. You can determine the coefficient of thermal expansion, glass and phase transitions as well as polymerization for various samples: liquids, gels, pastes, and certain solids. For example: cured and uncured resins, adhesives, glues, etc. can easily be characterized. Both thermal and time-dependent processes can be monitored with minimal effort.
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*Pulse Characterization Sensors
Pulse Characterization Sensors provide the ability to see and measure the temporal characteristics of pulsed and CW laser beams. Ophir Fast Photodiode Detectors are designed to convert optical signals into electrical signals which are then measured with third-party instrumentation such as oscilloscopes and spectrum analyzers. Accessories are available to connect to IS6 integrating spheres or fiber optic cables. Attenuating filter accessories are also available to increase their dynamic range. Different models offer silicon, UV enhanced silicon and InGaAs PIN photodiodes, covering a combined spectral range of 193 nm to 1700 nm. Rise times range from 25 picoseconds to 3 nanoseconds. The fast rise times are achieved by an internal reverse bias voltage circuit. Power is supplied by internal batteries and/or an external power supply depending on the model. Detectors should be connected to a 50Ω impedance in order to maintain their nominal rise times. They can be connected to higher impedance loads, but this will result in a significant increase in the rise time. If higher output voltage is required, it is recommended to connect the detector to a trans-impedance amplifier with an Input impedance of 50Ω
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Nanomechanical Test Systems
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Nanomechanical Test Systems
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Test Cell System
qCf FC25/100
The quickCONNECTfixture with an active fuel cell area of 25 cm 2 has been an integral part of our product portfolio since 2006. The excellent properties and the patented design of the cellFixture offer enormous advantages in the characterization of cell-internal components for fuel cells and electrolysis.
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Test Cell System
qCf FC50/125
qCf: Our revolutionary test cell system for the professional characterization of fuel cells.
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Nanomechanical Test System
Hysitron TI Premier
Bruker’s Hysitron TI Premier nanoindenter was specifically designed to deliver industry-leading, quantitative nanomechanical characterization within a compact platform. Built upon proven Hysitron technology, the TI Premier provides a broad suite of nanoscale mechanical and tribological testing techniques.
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Device Characterization
Probe systems for device characterization must be particularly flexible because many different measurements often must be performed; DC, IV/CV, Capacitance, HF, 1/f, temperature and more. The modular architecture of the PS4L product line is ideal for these broad requirements.
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Multi-Channel Controllers
7000 Series
The new 7000 Series MultiSource Multi-Channel Controller is designed for applications requiring a large number channels in a cost-effective and compact solution. With both laser driver and temperature controller options, the MultiSource is an excellent building block for system applications such as device burn-in and characterization.
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Ultra-Wideband (UWB) Test System
IQgig-UWB
The IQgig-UWB is ideal for both R&D characterization, high-volume production, and certification. Making it the perfect platform to enable a cost-effective, seamless transition from the lab to the manufacturing floor.
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Centrifugal FFF
CF2000
The new advanced Postnova CF2000 Series was developed to become the first professional modular Centrifugal FFF system available. It is completely controled by the NovaFFF single software platform which runs the entire system from autosampler to detectors. The CF2000 Centrifugal FFF incorporates the combined proven know-how and the technologies from three decades of leadership in FFF. Due to its unique design, the CF2000 Centrifugal FFF system offers more flexibility, higher robustness and better performance than traditional particle sizer systems. The CF2000 allows high resolution particle separation and sizing at the same time and consequently sets a complete new standard and offers a real alternative to traditional particle characterization techniques.
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Solutions for Nondestructive Characterization of Elastic
Sonelastic
Sonelastic® is a line of solutions for nondestructive characterization of elastic modulus and damping of materials by the natural frequencies obtained by impulse excitation technique.
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Toolset for NI TestStand
TS+
MESULOG TS + includes new configurable TestStand steps that simplify product characterization and validation, while reducing the time and cost of developing test sequences. With TS + , you can easily create advanced loop structures, save and replay datasets, display data dynamically, and include screenshots in your reports.
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Thermal FFF
TF2000
The new award winning Postnova TF2000 Thermal FFF Series was invented to become the first professional modular Thermal FFF system available. It is completely integrated by the NovaFFF single software platform which runs the entire system from autosampler to detectors. The TF2000 Series incorporates the combined solid know-how and the proven technologies from three decades of leadership in FFF. Due to its unique design, the TF2000 Thermal FFF system offers more flexibility, higher robustness and better performance than traditional chromatographic systems. No separation column with stationary phase is required anymore and consequently the TF2000 technology sets a complete new standard and offers a real alternative to column-based polymer characterization techniques.
