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Boron
a black and brown metalloid chemical element.
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Ceramic Process Carrier Pallets
Ceramic engineering specializing in Silicon Carbide, Boron Carbide, Alumina, Zirconia and Lead Zirconate Titanate (PZT) based ceramics, composites and thin films for High Strength, high temperature, semiconductive ceramic designed for use in wafer fabrication or hybrid circuits in vapor deposite ovens. Test Electronics will precision drill and customize pallets for your circuit board. Click on the Quote tab on the left then click on the Carrier Pallets tab to get an instant quotation on your process carrier pallets.
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Portable Metal Analyzer
SPECTROPORT
SPECTRO Analytical Instruments GmbH
When handhelds aren't enough, the amazing new SPECTROPORT portable metal analyzer applies more advanced OES technology in a unit as easy to use as a handheld analyzer. SPECTROPORT delivers many advantages of SPECTRO's portable OES flagship, SPECTROTEST, in a smaller, lighter package. It accurately analyzes elements such as carbon, sulfur, phosphorus, and boron. It's as fast as an XRF, with many analyses taking only a few seconds. And it enables effortless point-and-shoot performance, to minimize operator intervention and decision-making. It adds the convenience and simplicity of the best handheld analyzers to the accuracy and wide analytical range of SPECTRO's renowned OES technology. You get fast, ready response; flexible portability; intuitive ease of use; and minimal standardization efforts.
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Resistivity Standard
Resistivity Standards are bare silicon wafers available in 3 in, 8 in and 12 in sizes. The silicon is p-type (Boron) doped to nominal resistivity values, from 0.002 ohm.cm to 75 ohm.cm as available on the 3" model.
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Silicon Phosphor and Boron Analyze system
HS-ICP-MS
The Silicon Phosphor and Boron Analyze system HS-ICP-MS is the best system to measure the element like P&B in silicon material, the HS-ICP-MS can detect and analyze over 75 elements.
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Pure Boron Foils
MICROMATTER™ boron foils are also produced by laser plasma ablation; however, the deposition process is much more complex and time consuming than that for diamond-like carbon. Accordingly, only thin films, mainly designed for beam stripping of heavy ions in electrostatic accelerators, are available. All films are generally delivered on glass substrates coated with a release agent.
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Large Range Resistivity Tester
HS-SFRT
HS-SFRT silicon filament resistivity tester is an advanced silicon cylinder resistivity tester, which can measure silicon filament, silicon phosphorus ingot, silicon boron ingot, seed crystal and so on. As it eliminates Peltier effect, Seebeck effect, minority carrier inject effect and so on, So it improve the accuracy greatly. The testing resistivity ranges from 0.0005Ω·cm to 50000Ω·cm. It is accurate, stable and convenient and a good friend to Siemens polysilicon material producer, SH4 polysilicon material producer, UMG polysilicon material producer and so on.
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Semiconductor Large Range Type Tester
HS-PSTT
HS-PSTT large Range Type Tester is a high-grade semiconductor material Type testing equipment,has the feature that testing large range,special suitable for testing the high-Resistivity Silicon Material(contains Silicon Core, phosphorus stick, Boron stick and so on),the resistivity require range is 0.0001～19999Ω·cm, Covers all measurement requirements of various silicon material type testing at the semiconductor and solar energy level at present .
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Boron Enhanced Diamond-like Carbon Hybrid Foils
can be increased by sandwiching a thin layer of boron between two layers of diamond-like carbon. MICROMATTER DLC-B hybrid foils contain between 5% and 10% boron.DLC-B foils have remarkable flexibility, higher tensile strength and hardness. In most applications, their lifetime in particle beams is significantly greater than regular DLC foils. DLC-B foils are recommended for applications that require highest mechanical robustness and improved durability under beam conditions.
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Minority Carrier Lifetime Tester
HS-CLT
HS-CLT Minority Carrier Lifetime Tester has strong functions. It can not only measure carrier lifetime of wafer but also silicon ingot, silicon filament,silicon phosphorus ingot,silicon boron ingot, seed crystal and other irregular shape silicon material.The minority carrier testing ranges from 1μs to 6000μs, the minimum resistivity is 0.1Ω.cm, (can be extensive to 0.01Ω.cm). Dynamic curve monitoring in the whole process.
