- Virginia Panel Corporation
product
Signal, Contact, ITA, QuadraPaddle, 5 Amp, .025" Square Post for Wire Wrap with Anti-Rotation
610138122
Primary mating contact 610138200. (May mate with other Receiver contacts, as well.)Available in twin-female, crimp/solder, twin male, and wire-wrap design, QuadraPaddle contacts are engineered for flexible interconnect options. Rated at 5 amps continuous (1250 VAC) with a 2 ounce insertion force, QuadraPaddle contacts provide 4 reliable points of contact per pin, outstanding electrical performance, and low mating force.Specifications Operating Voltage & Current 5 Amps Max. Continuous; 600...show more -
product
Atomic Force Microscope
HDM Series
The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-a...show more -
product
Atomic Force Microscope
FlexAFM
For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand.
-
product
Atomic Force Microscope
3DM Serirs
Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
-
product
Atomic Force Microscope
Flex-Mount
Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM.
-
product
Atomic Force Microscope
XE7
Park XE7 has all the state-of-the-art technology you've come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, the XE7 allows you to do your research on time and within budget.
-
product
AFM (Atomic Force Microscope) Optical Platform
The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illuminat...show more -
product
Force Measurement
Using state-of-the-art technology, ABB provides purpose built solutions for your force and dimension measurement needs, making it possible for your production output to accurately match the most varying and demanding requirements.
-
product
Force Transmitter
LKVE/i
The PIAB LKVE electronic overload protection system consists of a force transmitter with amplifier and an electronic signal processing unit. The PIAB LKVE force transmitter is attached to a stationary line part. The rope is deflected via a slight angle between the two wheels and the clamping jaw. When loaded, the rope tends to straighten and applies a force which is transmitted to the load cell. The load cell in the PIAB LKVE delivers a signal proportional to the force on the load cell. The signal is amplified and is converted to 4-20mA. This standardized signal (4-20mA) allows distances between the force transmitter and the electronic unit to be 500 m.
-
product
Force Sensors / Force Transducers
HBM force sensors and force transducers measure static and dynamic tensile and compressive loads - with virtually no displacement. Your force load cell can be supplied in the most varied of designs and classes of accuracy. Typical force measurement application areas include bench testing, e.g. force measurement to check material quality and automation technology, e.g. for monitoring quality during reshaping or bonding operations.
-
product
Atomic Force Microscope
DriveAFM
The DriveAFM is Nanosurf’s novel flagship AFM platform: a tip-scanning atomic force microscope (AFM) that combines, for the first time, several capabilities in one instrument to enable novel measurements in materials and life sciences.
-
product
Force Tensiometer
K20
Our Force Tensiometer – K20 is a robust, semi-automatic instrument for the precise measurement of surface tension and interfacial tension. Using the ring and plate method as the main tensiometric methods, it produces reliable measurements for the routine quality assurance of your surfactant solutions and interfacial processes.
-
product
Inspection Microscope
Z-NIR
The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
-
product
Force Gauges
Mark-10 digital force gauges can be used in a virtually limitless number of tension and compression force testing applications. All force gauges are able to capture the peak force in both tension and compression and have selectable units of measurement. Force gauge capacities are available from 50 gF full scale to 2,000 lbF, the broadest force range in the industry. Mark-10 force gauges may be handheld or used with a force test stand and gripping fixtures to create a complete testing solution.
-
product
Vine-Shoot Diagnostics
FA-WOOD™
FORCE-A offers a service for vine-shoot mapping. This spatial heterogeneity analysis is a support tool for crop management (pruning, fertilization, grass management) for the practice of a sustainable viticulture.
-
product
Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
-
product
Force Sensors
Custom FlexiForce
With its paper-thin construction, flexibility, and force sensing ability, the FlexiForce FSR Sensor can measure force between almost any two surfaces and is durable enough to stand up to most environments. The unique construction and durability of these FSR sensors enables Tekscan to create custom-designed FSR sensors to meet the specific needs of many OEM customers. We also offer standard off-the-shelf sensor products for prototyping and low-quantity requirements.
-
product
Atomic Force Microscope
NX10
Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and better data, you can focus on doing more innovative research.
-
product
Force Sensors
Is defined as a transducer that converts an input mechanical force into an electrical output signal. Force Sensors are also commonly known as Force Transducers.
-
product
Force Tensiometer
K100
Our universal Force Tensiometer – K100 performs high-precision, automatic and reliable measurements of surface tension and interfacial tension, critical micelle concentration CMC and contact angle on solids, fibers and powders. With high-quality components and a uniquely wide range of methods, the instrument carries out many tasks in the field of surfactant analysis and wetting measurement for your quality assurance or research.
-
product
Monocular Microscopes
ACCU-SCOPE monocular microscopes use high-quality optics for bright, crisp images. Possibly the iconic and most recognized example of microscopes, monocular microscopes are compound microscopes with the outstanding feature of a single eyetube and eyepiece. Our monocular microscopes are durable and portable, making them favorites across a wide range of laboratories and educational environments including high schools, environmental science, and veterinary settings. ACCU-SCOPE monocular microscopes...show more -
product
Digital Force Gauge
Guangzhou Amittari Instruments Co.Ltd
The digital force gauge is a kind of simple and convenient multi-functional instrument for high-accuracy push force and pull force test. It is widely used in electronics, building hardware, textile, auto parts, ignition device such as lighter, fire fighting equipment, pen manufacturing, lock manufacturing, fishing gear, chemical, power machinery, scientific research institutions and other industries. For the push and pull load test, plug and unplug force test and destructive test etc.
-
product
Digital Microscopes
TAGARNO digital microscopes give you unique and easy to use magnification equipment to use in a variety of quality control processes as well as R&D efforts or in your repair and rework in an endless range of segments. The digital microscopy camera technology enables you to see any small object in ultra sharp magnification and to document your work with just a single click. It also allows multiple viewers at the same time and thereby greatly improves collaboration.
-
product
Force Measurement Systems
Micro Edge Electronics Private Limited
As a reputed organization, we are engaged in manufacturing, importing as well as supplying a quality range of Force Measurement System. All these products are manufactured using high quality ingredients sourced from reliable vendor of the industry. These products are extremely rigid in state and ensure longer operational life. A team of skilled engineers and efficient technicians manufacture these products.
-
-
product
Printing / Squeegee Force
CmPrint
Measurement of the Force-Time Curve while Printing. The first step into the manufacturing of electronic printed circuit boards (PCBs) is printing. The solder paste is printed on the PCB using a stencil. The equal distribution of the paste pressure is crucial and affects the overall quality of the finished circuit board. An important influencing factor is the accuracy and reproducibility of the squeegee force.
-
product
Infrared Microscope
DDR200/300 NIR
The McBain DDR200 NIR (for 200mm) and DDR300 NIR (for 300mm) provide high-speed defect detection and precision measurement on wafers and other parts. These cost-efficient systems offer unique advantages for both production and process development use, providing an optimum near-infrared (900-1700nm) solution when both subsurface defect detection and dimensional metrology are required.
-
product
Crimp Force Monitor
638007950
The crimp force monitor measures the force signature of a crimped terminal and compares it to a reference crimp. Depending on the limits programmed, the measurement will pass, fail, or be suspect.
-
product
Confocal Microscopes
Our confocal microscopes for top-class biomedical research provide imaging precision for subcellular structures and dynamic processes.
-
product
Acoustic Microscope
AMI D9650Z
The D9650Z incorporates the latest C-SAM technology with enhanced features to accommodate the testing of Power Modules as well as performing standard C-SAM operations. This new system configuration is optimized for inspection of heatsink bond integrity, thickness of bond layer and wire bond welds. Powered by our Sonolytics software platform with PolyGate technology, the D9650Z is ideal for failure analysis, process development and QC screening in low-volume production environments.
-
product
Electron Microscope Analyzer
QUANTAX EDS for TEM
Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
