Filter Results By:
Products
Applications
Manufacturers
HMM
simulates a person generating an ESD event while touching ground with a metal object.
-
product
Compact TLP/VF-TLP/HMM Probearm Set for Temperature Measurements
PHD-4001A
High Power Pulse Instruments GmbH
*Electrically isolated probearm kit for VF-TLP, TLP, HMM, HBM force and sense probingbased on the GGB Picoprobe Model 10 replacement probe tips*Buried coaxial cable channel for thermo-chuck in isolated chamber temperature measurements*Compatible with GGB Picoprobe Model 10 replacement probetips*Compatible with all standard micropositioner interfaces*High precision rotation of the probearm by backlash-free 80:1 gear*Rugged stainless steel design*SMA connectors
-
product
Probing Solutions
ES62X-CMPS
The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.
-
product
Automated Robot Test System
ATS-8000A
High Power Pulse Instruments GmbH
The ATS-8000A test system is a fully automated 2-pin probing solution for HBM, TLP, HMM and CC-TLP on package- and wafer-level.Future extension for CDM is optional.
-
product
HMM+™ Tester
Model 4702
The Model 4702 HMM+™ is a completely new tester primarily intended for device level testing and produces a current waveform as specified in the IEC-61000-4-2, from a 50 ohm source impedance system.*This tester provides device level test data that allows users to evaluate the IEC current waveform protection level of their devices. We included failure identification by leakage current increases in the 4702 tester so precise pass/failure levels can be closely measured.*The 4702 HMM+™ provides a new and improved test connection method for making quantifiable and repeatable device level HMM measurements.*Convenient, precise, repeatable operation*Computer controlled for automated testing
-
product
48 Ω HMM Pulse Force Probe
PHD-HMM-48-1
High Power Pulse Instruments GmbH
*High current wafer-level and package-level 98 Ω HMM probing with grounded DUT*Built-in high surge 48 Ω pulse reflection suppression resistor up to 80 A peak*Fast rise time < 0.5 ns due to low inductance GND loop*Variable pitch from 50 µm to 5 mm*Tungsten replacement probe tips*SMA pulse force pigtail*Compatible to PHD-3001A interface*High reliability
