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Kelvin Probes
Quantify changes in contact surface potential or work function difference of the Kelvin 'Junction' measuring the flow of charge from one material to another.
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Controlled Atmosphere
KP Technology offer a range of Kelvin Probes that work in a controlled environment including automatic control of relative humidity within the Kelvin Probe housing and integrated nitrogen atmosphere control.
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Micro-Ohmmeter
LOM-510A
The Micro-Ohmmeter has 4 digits, 0.02% basic accuracy and 1 resolution. The 4-terminal kelvin measurement connection minimizes lead resistance errors and 80 dB of ac noise rejection provides rock-steady readings even in noisy locations. The micro-ohmmeter comes with rugged 4-terminal test clips and a large selection of optional probes, clips and fixtures allowing attachment to any low-resistance unknown.
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Off-Set Kelvin Test Sockets
This is an innovative and robust contact technology for making Kelvin contact to 0.5mm pitch QFNs. The contact uses a tip that is angled to one side, matched to an orientation that's flat on the tip. Two such contacts placed in opposition will touch the pad within 0.125mm. And because the tip is offset, the probe diameter is a robust 0.39mm and the load board pad pitch remains 0.5mm.
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Scanning Kelvin Probe
Our large range of Scanning Kelvin Probes gives the user full access to 2D and 3D work function plots of samples ranging in size from 50 mm to 350 mm. With work function resolution of 1 - 3 meV, and the spatial resolution of the Probe tip diameter (0.05 mm with the SKP5050 model), the Scanning Kelvin Probe gives reliable, repeatable measurements for work function, contact potential difference and Volta potential.
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Single-Point Kelvin Probe
Our Single-Point Kelvin Probe system (KP020) is the introductory system in the KP Technology product family. The off-null signal detection method allows high-quality measurements of the Work Function/Fermi Level of materials.
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Specialist Test Probes
High Current Test Probes, Ultra-high Current Test Probes,Kelvin Test Probes, High Frequency Test Probes, Switching Test Probes
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temperature Measurement
Educated Design & Development, Inc.
Up to 8 resistance reading channels, 4-wire methodUp to 12 temperature reading chanels, use of Type K, 24 AWG, Teflon thermocouplesIn the Box:8 - data cable (Cat5e) to connect the isolation modules to the Resistance Reading Channels8 - Isolation Module connected between the HOT-30 and EUT (Equipment Under Test) to isolate high voltage8 - Banana Jack Sets (2 red, 2 black), to replace Kelvin Leads in tight places8 - Kelvin Probe Set12 - 72 inch K Type Thermocouple1 - USB2.0 Type A (standard) to Type B USB cable
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Ambient Single Point Kelvin Probe System
This single point Kelvin Probe System operates under ambient conditions and is small enough to be placed in a customized glowth box. The probe head operates with an oscillating membrane and can be easily exchanged. The preamplifier is integrated inside the probe head.
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Scanning Kelvin Probe Microscope
VS-SKP
The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.
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Kelvin Test Leads
Kelvin Test Probes, Kelvin Test Leads, based on the Parrot™ Clip Invention provide reliable contacts and connections for the Sense and for the Current leads .
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Multi-Test Resistivity Measurement System
Sheet resistance mapping of thin films with a collinear 4-point probe, Temperature co-efficient of resistance (TCR) of thin films with collinear 4-point probe, Precision temperature co-efficient of resistance (TCR) with 2-point Kelvin probes and precision surface temperature probe, resistor testing with 2-point Kelvin probes,Precision resistor testing with a Kelvin probe card, temperature co-efficient of resistance resistor test (TCR), and Standard TCR test of multiple resistors with Kelvin probes or a probe card.
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Contact Probes
Rika Denshi Group Contact Probes - specialty probes including fine pitch testing, high frequency testing, high temperature testing, kelvin test, and high current test, as well as standard probes for 0.4mm-, 0.5mm-, 0.65mm-, 0.8mm-, and 1.0mm pitch.
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Relative Humidity Kelvin Probe
RHC
The Relative Humidity Kelvin Probe (RHC) systems are the ideal solution for monitoring samples in a controlled atmosphere for contact potential difference (CPD)/work function (Φ) measurements.
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Ultra-High Vacuum
KP Technology offer a range of Kelvin Probes that work under ultra-high vacuum conditions, choose from single-point or scanning probes to add to your existing vacuum chamber, customize the UHV corner cube or consider the newest addition to the range, the Ф4 ultra-high vacuum scanning Kelvin Probe system.
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Ultra-High Vacuum Scanning Kelvin Probe
Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.
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Ultra-High Vacuum Ф4 Scanning Kelvin Probe
The Ф4 Ultra-high Vacuum Scanning Kelvin Probe system gives the user full access to work function measurements under vacuum with the ability to alter the temperature from 77 K to 860 K. The Kelvin Probe measurement has resolution of 1 - 3 meV for a 2 mm tip on a conducting sample. The sample is mounted on a plate that is located on a motorized (x, y, z) translator attached to a stainless-steel vacuum chamber. Phi 4 also comes with a photoemission spectroscopy system with a tuneable source (3.4 - 7.0 eV). The deep ultra-violet (DUV) light spot measures approximately 3 x 4 mm. Absolute work function measurements can be obtained with this system in the range of 4.0 - 6.5 eV with an accuracy of 0.05 - 0.1 eV.
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Ultra-High Vacuum Kelvin Probe
Our Ultra-high Vacuum Kelvin Probes give the user full access to work function and contact potential difference (CPD) measurements under vacuum. Each system comes with a high-quality, manual, or motorized translator that enables reliable and accurate tip-to-sample positioning, and the unrivalled tracking system always holds the tip separation constant during the measurement. Even under vacuum, the work function resolution is 1 - 3 meV.
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High Speed Microohmmeter
1750
Basic Accuracy: 0.02%Measurement Speed: 10 msRange : 2 m to 20 MResolution : 100 nProgrammable reference currentsGPIB, RS-232 and PLC compatibilityKelvin Klips, Spade Lugs or Kelvin Probes availableEasy to operate and easy to integrate1-year warranty
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Bond Meter Kit
R1L-BR1
The TEGAM Model R1L-BR1 bond meter is a purpose built, rechargeable battery powered portable instrument for ground bond measurements. The R1L-BR1 comes with BCP-10 push-pin probes and KAK-1M Kelvin alligator clips, it is all housed with in a ruggedized case. It can accurately make measurements with a resolution of 1 microohm. It has been selected and deployed in Afghanistan for use on the Kiowa Warrior Armed Reconnaissance Helicopter.
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High Speed Microohmmeter, HI/GO/LOW Outputs
1740
Basic Accuracy: 0.02%Measurement Speed: 10 msRange : 20 m to 20 MResolution : 1 Programmable reference currentsGPIB, RS-232 (model 1740/GPIB) and PLC compatibilityKelvin Klips, Spade Lugs or Kelvin Probes availableEasy to operate and easy to integrate1-year warranty
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Kelvin Clip Set
11062A
Create custom Kelvin probes for 4-wire resistance measurements; set contains only the two gold-plated clips
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Kelvin Probe Set
11059A
Reduce ground-related errors and contact resistance through gold-plated flat tweezers and special gripping surfaces
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Scanning Probe Microscopes
SpectraView 2500
* Ultra-low noise SPM* Colocalized nanochemical analysis by IR, THz, Raman, AFM* Cantilever probes are completely transparent* Versatile configurations: Kelvin Probe chemical potential, electrical, thermal and photon force
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Kelvin Probe Systems
Kelvin probe measures the work function difference between the tip and the sample when in thermoequilibrium state (a), and measures the electrical potential when the sample is illuminated (b), which is the sum of the difference in workfunction and internal/external-applied voltages.
