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Charge Meter
probe-type charge meter that can easily measure the amount of discharge charge that causes static electricity destruction in the manufacturing, inspection, and assembly processes of electronic devices.Many ESD phenomena that impair electronic devices are represented by the CDM ( Device Charging Model). The CDM is a model that represents a phenomenon in which a high peak current flows at high speed when the device itself is charged and its external electrode is grounded. The coulomb meter measures the amount of discharge charge, which is the integral value of the current, with high accuracy.
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ESD Testing & Latch-Up Testing Services
EAG is an industry leader in ESD testing (Electrostatic Discharge) and Latch up testing. Our highly experienced engineering team use their industry leading knowledge and years or real world experience of the latest semiconductor technologies, circuit design, and device physics to optimize our customer's ESD and latch-up results. Human Body Model (HBM) and Machine Model (MM), Charged Device Model (CDM), Latch-up, Transmission Line Pulse (TLP).
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Transmission Line Pulse Testing
Transmission Line Pulse testing, or TLP testing, is a method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures. In the Transmission Line Pulse test, high current pulses are applied to the pin under test (PUT) at successively higher levels through a coaxial cable of specified length. The applied pulses are of a current amplitude and duration representative of the Human Body Model (HBM) event (or a Charged Device Model – CDM – event in the case of Very Fast TLP, or VF-TLP).
