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Hyperconverged Platforms
Hyper-Unity® seamlessly integrates multiple RES form-factors, Ethernet switches, and software-defined storage (SDS)/ hyper-converged infrastructure (HCI) software to deliver all-flash performance for virtualized applications at less than half the cost of traditional storage. It brings the advantages of a Public Cloud to operations on the tactical edge, optimizing efficiency through dynamically provisioned resources, streamlining IT management, and providing a robust, scalable and turn-key infrastructure that can be immediately deployed.
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Integral Intelligent Flame Detector
FS-100
FS-100 utilizes SMT technology which integrates a photoelectric sensor, a microprocessor, and a Human-Computer Interface (HCI) and an output interface together, sending out various outputs including an ON/OFF flame signal, a fault signal, a 4-20mA signal, and an RS-485 output (meets the MODBUS standard) via the quick connector.
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PCIe - High Performance Radios
Supports up to 150 Mbps data rateCompliant with IEEE802.11 b/g/n standardsCompliant with IEEE 802.11b, 802.11d, 802.11e and 802.11g standards and the 802.11i specification Includes signal-sustain technology (SST) rate-over-range enhancements such as low-density parity check (LDPC), and maximum likelihood demodulation (MLD)Supports all mandatory IEEE 802.11n features as well as several optional features such as HT40, half-guard interval in HT40 and Rx space-time block coding (STBC)Supports low-power sleep modes and wake-on-wireless (WoW) LANFeatures the Atheros AR3012 Bluetooth 4.0 + HS chipset and Bluetooth Class 1 RadioUSB 2.0 device interface supports standard HCI USBRoHS compliant
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Low Temperature Operating Life (LTOL) Test
LTOL
LTOL is being more used more and more frequently by manufacturers of low geometry devices as part of the qualification process, and in order to gain more failure data, a greater understanding of different failure modes of the device at low temperature, and to enable more complete reliability estimations. As device geometries decrease and frequencies become higher, Hot Carrier Injection (HCI) increases and the resulting degradation causes the deterioration of device characteristics and ultimately leads to failure.
