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Zener Diode
current flow from cathode to anode reverses when zener voltage reached.
See Also: Diode, Laser Diode, Diode Test, Photodiode
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product
Diode Tester
FEC VF40CM
Frothingham Electronics Corporation
The VF40CM is intended for testing VF, HALF CYCLE SURGE, and THERMAL RESPONSE/RESISTANCE on small- and medium-power diodes and rectifiers. It can also measure THERMAL RESPONSE/RESISTANCE on NPN and PNP bipolar transistors using an external user-supplied VCB supply.The VF40CM also is sometimes used to measure VZ of low-voltage zener diodes up to the compliance voltage limit of the tester. 20V at 20A is possible.
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product
Single Head Component Testers
34XX
Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Shunt Voltage References
Analog Devices offers a broad line of shunt precision voltage references that combine excellent accuracy and temperature stability with low noise and small packages. These devices operate in a manner that is functionally equivalent to a Zener diode. The bias current must be set higher than the sum of the maximum quiescent current of the voltage reference and the maximum expected load current. Since shunt voltage references are typically biased with a resistor, the voltage reference can operate on a wide range of input voltages.
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Signal Interface
Our signal interface products provide signal conversion and electrical isolation between sensors and other field devices and a control circuit. Intrinsic safety modules add Zener diodes, which limit the amount of electrical energy on intrinsically safe circuits.
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Atlas ZEN Zener Diode Analyser
ZEN50
The Atlas ZEN is ideal for testing Zener diodes (including avalanche diodes), transient suppressors, LEDs and LED strings.
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Programmable Parametric Tester For Discrete Semiconductors
IST-8800
IST Information Scan Technology, Inc.
The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
