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Functional ATE
Automated application specific testing system.
See Also: Functional Test, ATE, Functional Test Systems
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Electronics Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Functional Test
xUTS
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Benchtop Automated Functional Test
midUTS
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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Functional Test Fixtures
Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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ISP Programmer Superpro Is01
Features:Until now,Support IC manufacturer, pcs devices and keeps growing.1)High speed thanks to the flexible hardware engine. Programming speed adjustable for complicated application environments brought by user target board, length of ISP cable etc.2)Stand-alone and PC-Hosted (USB2.0 High Speed) dual mode;3)Supports ISP programming of devices with I2C, SPI, UART, BDM, MON, MW, JTAG, CAN, ICC, RS232 and any other serial port.4)ATE interface;5)Over-current and ESD protection to protect your equipment;6)DLL and API for easy integration into customers’ system.Hardware Specifications:1) ISP cable integrates I2C, SPI, UART, BDM, MON, MW, JTAG, CAN, ICC, RS232 interfaces。2) VDD (0-5.5V /0.5A) and Vpp (0-15V / 0.2A) lines provided to power the target board and the target devices.3) Cable driver circuit supports target devices of voltage level 1.5-5V and is ESD protected.4) USB 2.0 (high speed) interface for PC hosted mode and management of project files on SD card.5) A 20 Characters x 4 lines LCD and a 6-key keypad are built with it for stand-alone operation. In stand-alone mode project files are stored on the SD card (up to 16GB). The number of the project files is limited only by the capacity of the SD card.6) ATE interface is built for easy external hardware control. 6 lines SEL0-SEL5 are for project selection (maximum 64 files); 2 command lines START and STOP; 3 STATUS lines PASS, FAIL and BUSY. All signals are optical-isolated.7) A universal AC adaptor of DC12V/2A is included for power supply.8)WINDOWS XP/Vista/Win7/Win8/Win10 32/64bit compatibility.Software Specifications:1) Supports almost all devices with ISP interface.2) Supports Jam and Staple files from ACTEL and ALTERA; Direct C files from ACTEL.3) Programming speed selectable (High, Normal and Low) for complicated applications such as different cable lengths, different target load characters.4) Dynamic buffer function. Application examples include device S/N, MAC address, frequency or transducer calibration etc.5) File format on SD: FAT16, FAT32.6) Functions for IP protection: Project security, SD security, batch control, administration management etc. 7) API and DLL provided for easy integration into customers’ system like ICT and ATE.8) Software provides the features for multiple units to work concurrently controlled by USB HUB.Applications:1)R&D application like in-circuit test and debug.2)Volume production. Devices may be programmed after the board is fully assembled. One example is the serial number writing to an on-board serial device.3)Field application. Comes with portability, stand-alone mode and mobile data storage media (SD card), it is suitable for field test, debug and data acquisition.4)Third application modules. Friend s/w interface (DLL and Virtual Com communication command set) and h/w interface ( ATE and USB) are provided and make it very easy for customers to integrate ISP01 as a functional module into their systems. One example is the ICT equipment. With this integration user can finish in-circuit test and in-circuit programming in one step.
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Powerful, Fully Integrated Workstation for Emission Microscopy
PEM-1000
The PEM-1000 emission microscope incorporates the latest technology in real time, high quantum efficiency, mega-pixel CCD detectors in a back-thinned cooled camera. A portable system, the PEM 1000 can interface with all analytical probe stations, ATE (automated test equipment) and bench top configurations for high speed functional testing.
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Reliability Testing
ELES Semiconductor Equipment SpA
ELES designs and manufacturers reliability test solutions to verify the performance of integrated circuits from concept validation to high volume production during all the test phases. No other company can provide universal equipment for all the reliability tests, or can guarantee a seamless data flow between phases or can apply on chip embedded reliability engineering for data tracking and failure investigation. Clients use our functional test data to proactively analyse variations between lots, between temperature extremes and during lifetime (often these defects escape ATE). The improvements to products and processes needed to arrive at zero defects cannot be driven by the quantity of Big Data alone, the quality of reliability data is a strategic advantage that only ELES can provide.
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Functional Testing
Whatever your functional testing requirement, whether analogue, digital, or a combination of technologies, we have a solution. With over 2500 applications delivered in this field we have a level of experience that cannot be matched. Ensure the reliability of your product with our functional testing tools. Our functional test solutions range from completely standalone applications to those matched for our FLEX range of ATE test systems. Whatever your testing needs, we will help you choose the best option for you.
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Functional Testing of Printed Circuit Boards, Sub Assemblies and Finished Products
Testpoint
Yelo Testpoint is an extremely modular and flexible system, allowing you to scale to any size operation, and to add almost any new test requirements. Ideally suited to cellular manufacturing, the system can be used to complement an existing ATE, as a functional test add-on, or as a diagnostic work station. Its compact, space-saving construction has multiple interface positions to accommodate both horizontal and vertical connections.
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ATE Development
Aero Engineering Support Group
ATE Development Aero Engineering Support specializes in designs and manufacturing of a wide variety of Automatic Test Equipment (ATE) of support for military avionics, commercial avionics, industrial sector, etc. AESG is committed to providing industry leading equipment that are designed to be scalable and expandable ATE capable of providing reliable functional test solutions for any electronic assembly or Circuit Card Assembly. New from Aero Engineering Support is the A2500 system, providing:
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Bi-Directional Differential-TTL I/O PXI Card
GX5641 Series
The GX5641 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), functional test, and factory automation applications. The GX5641 consists of 64 bi-directional TTL-differential I/O channels. Each channel has two ports (TTL and differential) which can be individually set to operate in either conversion or static I/O modes.
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Solar ATE
MS 1534
The Inverterless ATE is an automatic test equipment which is used to test the all functional and various test conditions of Inverterless Solar Unit. This ATE shall be a GO/NOGO Tester for Inverterless Solar Unit. All production units can be tested with this ATE for functional testing and clearance. This ATE reduces the man effort for quality checks and detects the failure units. The Inverterless ATE can check the UUT with minimum user interactions. It shall test and generate test report in PDF format for the conducted tests with necessary data. The ATE operates on 230V AC power. The ATE has In-Built AC-DC converter which provides 12V DC for operate the unit. Also it has additional AC-DC converter to simulate solar power to the Inverterless units. The main objective of the ATE is to test the Inverterless S in all possible test scenarios without external test equipments and less user interactions.
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ATE For ADC Module
MS 1527
The Semi-ATE is used for testing the analog ADC. It shall carry out the functional test on ADC analog module. The ATE shall have all necessary IO signals on the connector end. The semi-ATE can carry out the functional tests on ADC analog module with host PC or laptop. It provides +15V, -15V, +5V & -5V to module and +2.5V high precision reference voltage. It can able to control keysight N6700B Power supply mainframe using RS422 interface.
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VXI Video Processor System
65VP1
NAI’s 65VP1 is a Video Processor System (VPS) on a VXI board. Capable of highly accurate video stimulus and measurements, this state-of-the-art instrument is the culmination of over three generations of Automatic Test Equipment (ATE) development programs. It provides increased functional density, and it reduces power consumption, size, and cost of the overall system. The 65VP1 is ideally suited for defense and commercial ATE programs, including television applications.
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Spring Probes & Hyperboloid Contacts
In-Circuit / Functional Probes, Socketless X Probes®, High Current Probes, Double Ended Probes, ATE Interface Probes, integraMate®
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Bi-Directional Differential-TTL I/O PXI Card
GX5641
The GX5641 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5641 consists of 64 bi-directional TTL-differential I/O channels. Each channel has two ports (TTL and differential) and can be individually set to operate in either conversion or static I/O modes.
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Bi-Directional Differential-TTL I/O PXI Card
GX5642
The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.
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DUT Matrix 32 DUT Matrix Channels
40-530-021
The 40-530-021 is a high density 32x8 1 pole reed relay matrix. Typical applications are signal routing in functional ATE and data acquisition systems. It consists of highly reliable sputtered ruthenium reed relays that offer >10e9 switching cycles to ensure maximum switching reliability with a long service life and stable contact resistance. Larger arrays can be built by daisy-chaining the common signals from multiple PXI modules
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PXI Dual 10x4 Matrix 2A 1 Pole
40-546-001
Model 40-546-001 is a high density dual 1-pole 10x4 power matrix module. It is also available in single 10x4, single 10x8 or single 20x4 relay formats: Typical applications include power routing in Functional ATE systems, specifically automotive electronics, for example testing of Engine Management Units.
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PXI 4 Slot BRIC 180x8 2-Pole (6 sub-cards)
40-561A-022-180X8
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8 slot PXI sizes to suit all high performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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PXI 8 Slot BRIC 506x8 1-Pole (11 sub-cards)
40-560A-121-506X8
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8 slot PXI sizes to suit all high-performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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PXI 8 Slot BRIC 138x16 1-Pole (6 sub-cards)
40-560A-121-138X16
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8 slot PXI sizes to suit all high-performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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PXI 8 Slot BRIC 368x8 1-Pole (8 sub-cards)
40-560A-121-368X8
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8 slot PXI sizes to suit all high-performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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PXI 8 Slot BRIC 506x8 1-Pole Dual Analog Bus (11 sub-cards)
40-560A-121-506X8-M
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8 slot PXI sizes to suit all high-performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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PXI 8 Slot BRIC 322x8 1-Pole Dual Analog Bus (7 sub-cards)
40-560A-121-322X8-M
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8 slot PXI sizes to suit all high-performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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PXI 8 Slot BRIC 44x8 1-Pole (2 sub-cards)
40-562A-121-44X8
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8-slot PXI sizes to suit all high performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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PXI 8 Slot BRIC 22x16 2-pole (2 sub-cards)
40-562A-122-22X16
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8-slot PXI sizes to suit all high performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
