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Bit Error Rate Tester - PXI
BERT 1001/1005 Series
The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
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Bit Error Rate Tester - MATRIQ
The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
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PAM4 Bit Error Rate Tester.
BERT-1102
The BERT-1102 is a 4 or 8-channel PPG and Error Detector for the design, characterization and manufacturing test of optical transceivers and opto-electrical components with symbol rates up to 29 GBaud/s in both NRZ and PAM4 formats. With scalability and exceptional signal fidelity, it is a cost-effective test solution for up to 400 Gb/s communication eco-systems.
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ABex PXI to Analog Bus Bridge with Digital IOs
ABex AM-300 Controller
The ABex system controller ABex AM-300 is required to control the analog bus of a ABex chassis. It is used as an interconnection bridge between PXI and ABex backplane.In addition it features a whole bunch of additional functionality. Despite the 96 open drain outputs it has galvanically isolated IOs, and communication interfaces.
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Automated Coherent Receiver Tester
CoRx Tester.
Quantifi Photonics’ CoRx Tester provides automated measurement of key coherent receiver performance parameters. The CoRx Tester is comprised of a pre-configured PXI chassis, a two-channel tunable laser, a polarization controller, and a two-channel Variable Optical Attenuator (VOA) with built-in power meter. Just connect the two optical outputs to your Integrated Coherent Receiver (ICR), connect your ICR to the oscilloscope and let the CoRx Tester software do all the rest.
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MTM-Bus Tester
PXIe-1149.5
The Corelis PXIe-1149.5 is a versatile, multi-mode instrument for interfacing with MTM-Bus modules. The PXIe-1149.5 adds MTM-Bus master, slave, and monitoring with full IEEE-1149.5 electrical and protocol compatibility with a standard PXIe interface for convenient integration into any Test Program Set (TPS).
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Diode Tester
FEC200E
Frothingham Electronics Corporation
The FEC200E is an automatic computer- controlled diode and rectifier tester. It is controlled by a standard PC-compatible computer running FreeDOS.
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Tester for Alternator Stator Windings and Diode Bridges
MS014
The equipment combines two devices: tester of stator windings and diode bridges. The device has small dimensions and a light weight, it was developed according to the requirements of contemporary service stations.The feature of the handset tester is diagnostics of stator windings and diode bridges with no additional testing and measuring devices.Diagnostics of stator windings is carried out through automatic identification of phase connection, detecting winding integrity and measuring the difference in phase distortion.
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Diode Module Scanners
Scan500
Frothingham Electronics Corporation
The Scan500 scanners are add-on scanners for diode modules, to be used with a tester such as the FEC200.
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AMIDA ATI 600 Tester
AMIDA ATI 600 Tester is a dedicated test system for semiconductor components (MOSFET, BJT, DIODE, ... etc.), which can accurately and quickly measure product parameters through form filling and editable program control. In practical applications, AMIDA ATI 600 Tester is the best choice for users, whether it is CP or FT mass production testing, or research projects of component characteristics.
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Automated Connector Tester
GCI's Automated Connector Tester is a self-contained test bench providing reliable testing of filtered and non-filtered electrical connectors. The ACT automates the tedious process of testing each pin against all others and shell for DC and AC leakage. For filter connectors, the ACT accurately measures pin-to-shell capacitance. For pins protected by diodes, the ACT provides leakage and breakdown measurements. The ACT also verifies pins which are intentionally shorted to each other or to the shell.
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Diode Tester
FEC VF40CM
Frothingham Electronics Corporation
The VF40CM is intended for testing VF, HALF CYCLE SURGE, and THERMAL RESPONSE/RESISTANCE on small- and medium-power diodes and rectifiers. It can also measure THERMAL RESPONSE/RESISTANCE on NPN and PNP bipolar transistors using an external user-supplied VCB supply.The VF40CM also is sometimes used to measure VZ of low-voltage zener diodes up to the compliance voltage limit of the tester. 20V at 20A is possible.
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Measurement & Diagnostic Products
DURST Motor & Electric Industries Pty Ltd.
DURST Measurement & Diagnostic Products; circuit tester, vehicle battery analyzer, multimeter, dedicated automotive multimeter, clamp meter, sound level meter, oxygen sensor tester, diesel engine tachometer, multisystem ignition analyzer, faultfinder, circuit tester, diode tester, regulator tester, growler for testing motor insulation, armature/commutator tester, diagnostic testers, current clamps, optical photo/contact tachometer, etc.
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Single Head Component Testers
34XX
Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Functional & ICT Tester
igentic® 621t
Growing demand for light emitting diode (LED) products and increasing testing complexity continue to challenge electronic printed circuit board (PCB) manufacturers. The igentic® 621t is a flexible PCB tester that ensures quality while increasing production. The tester can handle multiple PCB products and test for light measurements, resistance and push button or post detection, as required.
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Portable Test Equipment
TP0620
The portable tester TP0620 is designed for easy and fast functional control of the major power semiconductors in the lab or on site (IGBT, MOSFET, diodes, thyristors and other components).
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Bypass Diode Tester
BDT
Our bypass diode thermal tester is designed to assess the adequacy of the thermal design and long-term reliability of PV modules bypass diodes, which are used to limit the detrimental effects of module hot spot susceptibility.
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SCR Diode Testers
SCRs and Diodes are used in the power sections of various power systems. A SCR Diode Tester is an important piece of equipment to determine if a SCR or a diode is defective in a power circuit. It is difficult and time-consuming to troubleshoot SCRs and Diodes with a digital meter.
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SMD Tester Capacitance Resistance Diode Tweezers Test Pen Multimeter SMD Meter
VA503
Shanghai Yi Hua V&A Instrument Co., Ltd. CO.,LTD
SMD tester Capacitance Resistance Diode Tweezers Test Pen Multimeter SMD Meter. SMD Components Identifier
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Surge Suppressor Tester
(SST) 450
The ATSI SST-450 Surge Suppressor Tester is designed to quickly and easily test allcommonly used transient voltage suppressors: metal-oxide varistors (MOVs), gas-discharge tubes (GDTs), silicon avalanche diodes (SADs), thyristor surge protective devices (TSPDs), and hybrid devices.
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LASER DIODE TESTER
LASER DIODE TESTER LD-607 Basic Functions LIV curve test. LD horizontal and vertical test. LD Spectrum test
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Portable Maintenance Testers
PULSOR
Portable maintenance testers Pulsor 2kV, Pulsor 4kV, Pulsor 7kV To measure Leakage current ID, IR in given voltage range of power components: IGBTs, MOSFETs, Diodes, Thyristors, Varistors…
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Photovoltaic System Bypass Diode Tester
FT4310
Hioki is pleased to announce the launch of the Bypass Diode Tester FT4310 for Photovoltaic Systems. The FT4310, which is designed to test bypass diodes in strings of crystalline photovoltaic cells, can be used to detect open and short-circuit faults in bypass diodes by string either in daylight or at night. The instrument is the first portable device capable of detecting bypass diode open faults in operating panels (without requiring the panels to be shielded from sunlight).
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Compact Semiconductor ATE
QST286
Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST286 is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features makes it ideal for high throughput production testing of wide range of low pin count medium power ICs as listed below but not limited to Optocouplers, Isolators, LEDs, Photo diodes, Photo transistors, Photo sensors, Photo detectors , Analog Mux , Relays and more.
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Programmable Parametric Tester For Discrete Semiconductors
IST-8800
IST Information Scan Technology, Inc.
The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
