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Ethernet Test
Evaluation of a packet based ethernet network's wiring and signaling.
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PXIe-8521, 4-Port, 100BASE-T1 PXI Automotive Ethernet Interface Module
786771-01
PXIe, 4-Port, 100BASE-T1 PXI Automotive Ethernet Interface Module - The PXIe-8521 is a 100BASE-T1 unshielded twisted pair (UTP) Automotive Ethernet interface for developing applications with the NI‑XNET driver. The PXIe-8521 is ideal for developing applications that require … Automotive Ethernet to test and validate automotive electronic control units (ECUs). The interface provides up to four independent endpoints or up to two network terminal access points (TAPs). It features onboard hardware timestamping and can act as up to four separate 802.1AS masters or slaves, which allows it to synchronize with an external network as well as the rest of a PXI system. The PXIe-8521 also provides LEDs on the front panel so that you can monitor the network link and activity.
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PXIe-8523, 4-Port, 100/1000BASE-T1 PXI Automotive Ethernet Interface Module
787311-01
PXIe, 4-Port, 100/1000BASE-T1 PXI Automotive Ethernet Interface Module - The PXIe-8523 is a 100/1000BASE-T1 unshielded twisted pair (UTP) PXI Automotive Ethernet Interface Module for developing applications with the NI‑XNET driver. With this hardware, you can develop applications … that require Automotive Ethernet to test and validate automotive electronic control units (ECUs). The PXIe-8523 provides up to four independent endpoints or up to two network terminal access points (TAPs). It features onboard hardware timestamping and can act as up to four separate 802.1AS masters or slaves, so it can synchronize with an external network as well as the rest of a PXI system. The PXIe-8523 also provides LEDs on the front panel to help you monitor the network link and activity.
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PXIe-8623, 4-Port, 100/1000BASE-T PXI Automotive Ethernet Interface Module
787992-01
PXIe, 4-Port, 100/1000BASE-T PXI Automotive Ethernet Interface Module - The PXIe-8623 is a 100/1000BASE-T unshielded twisted pair (UTP) PXI Automotive Ethernet Interface Module that helps you develop applications with the NI‑XNET driver. With the PXIe-8623, you can develop applications that require Ethernet to test and validate automotive electronic control units (ECUs). The PXIe-8623 provides up to four independent endpoints or up to two network terminal access points (TAPs). It features onboard hardware timestamping and can act as up to four separate 802.1AS masters or slaves, making synchronization with an external network as well as the rest of a PXI system possible. Additionally, the PXIe-8623 features LEDs on the front panel to help you monitor the network link and activity.
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PXIe-8522, 4-Port, 1000BASE-T1 PXI Automotive Ethernet Interface Module
787312-01
PXIe, 4-Port, 1000BASE-T1 PXI Automotive Ethernet Interface Module - The PXIe-8522 is a 1000BASE-T1 unshielded twisted pair (UTP) module for developing applications with the NI‑XNET driver. With this hardware, you can develop applications that require Automotive Ethernet to test … and validate automotive electronic control units (ECUs). The PXIe-8522 provides up to four independent endpoints or up to two network terminal access points (TAPs). It features onboard hardware timestamping and can act as up to four separate 802.1AS masters or slaves, so it can synchronize with an external network as well as the rest of a PXI system. The PXIe-8522 also provides LEDs on the front panel to help you monitor the network link and activity.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Test Solutions
Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.
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Tactical Radio Test Set
CTS-6010
The CTS-6010 brings an entire test bench to your front lines. Enable your technicians to detect equipment faults and verify operational capabilities at the I- and O-levels, saving valuable diagnostic time and cost.
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10 Gbit Ethernet Card, PXIe Form Factor
ADQ10GBE
The ADQ10GBE module enables fast network connection from a cPCIe/PXIe chassis to an external host computer. It occupies a single slot in an 3U cPCIe/PXIe chassis and can be used with backplanes supporting up to x8 Gen2 PCIe. All necessary software drivers are included and can be installed on the PXIe controller. ADQ10GBE can be used under Windows 7 (32 or 64 bit), Windows 8 and 8.1, and Linux (native support or ixgbe source code).
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PXIe-8285, 2-Port, 25 Gigabit, RDMA PXI Ethernet Interface Module
788510-01
The PXIe-8285 is a high-performance 25-Gigabit remote direct memory access (RDMA) interface for PXI Express. This module includes two 25-Gigabit Ethernet SFP28 ports in a single-slot PXI Express module and supports RDMA over Converged Ethernet (RoCE).
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PXIe-8280, 1-Port, 50 Gigabit, RDMA PXI Ethernet Interface Module
788261-01
The PXIe-8280 is a high-performance 50-Gigabit remote direct memory access (RDMA) interface for PXI Express. This module includes one 50-Gigabit Ethernet QSFP28 port in a single-slot PXI Express module and supports RDMA over Converged Ethernet (RoCE).
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PXIe-8245, 4-Port, 10/100/1000BASE-T PXI Ethernet Interface Module
787313-01
The PXIe-8245 supports Ethernet-based communication between PXI hardware and external instruments and devices. This PXI Ethernet Interface Module includes four RJ45 10/100/1000BASE-T Ethernet interface ports in a single-slot PXI Express module.
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PXIe-8238, 10 Gigabit PXI Ethernet Interface Module
784976-01
10 Gigabit PXI Ethernet Interface Module—The PXIe-8238 is a high-performance 10-Gigabit ethernet SFP+ interface for PXI Express based on the Intel 82599 10Gb ethernet controller. It includes two 10-Gigabit ethernet SFP+ ports in a single-slot PXI Express module and is compatible with both copper and fiber optic cabling.
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PXIe-8240, 40 Gigabit PXI Ethernet Interface Module
784977-01
40 Gigabit PXI Ethernet Interface Module—The PXIe-8240 is a high-performance 40-Gigabit Ethernet QSFP+ interface for PXI Express based on the Intel XL710 40Gb Ethernet controller. It includes two 40-Gigabit Ethernet QSFP+ ports in a single-slot PXI Express module and is compatible with both copper and fiber optic cabling.
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PCI Mezzanine Card
PNIC1G
Each Ethernet interface supports 10, 100 and 1000 Mbits transmission rates with auto-negotiation for full duplex operation; 10 and 100 Mbit/s transmissions for half duplex operation, and is equipped with a 32 Kbit Serial EEPROM.
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PXIe-8234, 2-Port Gigabit PXI Ethernet Interface Module
780244-01
Vision Software Included, 2-Port Gigabit PXI Ethernet Interface Module—The PXIe-8234 with Vision Acquisition Software can acquire images from the fastest GigE Vision cameras. It transfers images at full Gigabit Ethernet bandwidth on both ports simultaneously, and it is optimized for extremely low CPU load. The PXIe-8234 with Vision Acquisition Software provides full GigE Vision bandwidth at every port, giving you the bandwidth you need for your most demanding vision applications. It also includes NI Vision Acquisition Software, which is driver software for acquiring, displaying, logging, and monitoring images from a multitude of camera types. With a set of easy-to-use functions and example programs, you can quickly create applications using LabVIEW, C, C++, C#, Visual Basic, and Visual Basic .NET.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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ARINC 818 Tester
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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SoC Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
