- Pickering Interfaces Inc.
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Switching System Test Tools
eBIRST
The eBIRST toolset consists of three different tools that support 200-pin LFH, 78-pin and 50-pin connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence. These tools work by measuring the path resistance at the switching system external connectors using four-wire measurements, quickly establishing whether the path is good, has increased resistance or has failed. Below are links to various eBIRST tool information:
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Diagnostic Test System™
The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
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Dynamically Controlled, High Speed Digital I/O PXI Express Card
GX5292e
The GX5292e is a high performance, cost-effective 3U PXI Express dynamic digital I/O boards offering 32 TTL or LVDS input or output channels with dynamic direction control. The GX5292e also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 100 MHz. The single board design supports both master and slave functionality without the use of add-on modules.
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Virtual tester
Emulate tester patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test programs. Reads the actual ATE program and creates a Verilog /VHDL simulation test bench.
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Video Generator-Analyzer
VQTS-200
VQTS-200 is a self-contained solution, combining: 3G-SDI/HDMI/DVI player/recorder - based on AJA Kona LHi card Built-in RAID storage - uncompressed YUV signals in and out, up to 1080p60 Visual, instrumental and automated tests using VQL Test Patterns Library Sophisticated image quality VQMA3 software analyzer - complete quality report in 2 seconds Ideal tool for development labs, software developers and high volume manufacturers Easy-to-use tool, instantly revealing your video camera, codec, scaler, converter or other video device performance User-selectable reporting modes: machine-readable file with Pass/Fail marks detailed multi-page PDF document
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Error Detector Remote Head 32 and 17 Gb/s
N4952A
The N4952A is an affordable and compact error detector remote head available in 4 to 17 Gb/s and 5 to 32 Gb/s configurations. Compatible with the N4960A Serial BERT controller, it is the perfect solution to test up to 32 Gb/s per channel for 100 Gigabit Ethernet applications and other high-data rate devices. The N4952A error detector supports PRBS or user patterns and operates up to 32 Gb/s in a single band with no gaps or missing data rates. The remote head allows the test equipment to be located very close to the device under test, eliminating the need for long cables that degrade signal quality.
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Memory Diagnostic Utility
MemTest86
MemTest86 is the original, free, stand alone memory testing software for x86 computers. MemTest86 boots from a USB flash drive or CD and tests the RAM in your computer for faults using a series of comprehensive algorithms and test patterns.
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Bennewart Flex Tester
UI-FT26
Bennewart Flex Tester, also named as Whole Shoe Sole Flexing Tester, is used to test outsole flexing resistance. The whole shoe sole flexing tester is intended to know the effect of sole materials and surface patterns on cut growth by flex sample in 90°as per ISO 20344, ISO 17707, DIN 53543 and etc.
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JTAG (and IJTAG) Environment Tool Suite
SAJE
SAJE is the SiliconAid Suite of JTAG related standards focused tools for chip development, verification, validation and patterns generation of ATE, Board, and System Test. Each tool can be used as a point tool by itself to compliment other tools in your flow. However, the SAJE Tool Suite used together in a flow can provide a total solution that also leveraging previous steps for debug and analysis.
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Cryogenic Millimeter-Wave / Microwave Test Fixtures and Calibration Kits
upj10
KEYCOM''s cryogenic millimeter-wave / microwave test fixtures and calibration kits are specifically optimized for testing the performance of patterns between the edges of printed boards(edge type) and circuit testing on the printed boards(probe type). They are also designed to minimize heat capacity by miniaturizing their dimensions so they cool off efficiently, and materials with low coefficient of linear thermal expansion such as invar are used for major parts where high dimensional stability is required. Their operating frequency ranges from DC to 110GHz.
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MIMIC® Wireless Simulator
Mobile device and network complexity is continuously increasing due to the multitude of devices, technologies and traffic patterns. As a result, wireless equipment manufacturers must test their products from every different aspect. They need to do this to improve quality and reduce costs.
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Pattern Generator
PI-2005
As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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4 Channel 24.5~ 29.0 Gb/s Pulse Pattern Generator and Error Detector
CA9808
The UC INSTRUEMNTS CA9808 4 Channel 24.5 ~ 29.0 Gb/s (100Gb/s) Pulse Pattern Generator and Error Detector is a high performance, flexible and cost effective four channel Pulse Pattern Generator and Error Detector that can operate from 24.5 Gb/s to 29 Gb/s each Channel. 4 channel 29.0 Gb/s make it total up to over more than 100 Gb/s testing capacity. It is also a standalone Bit Error Rate test solution that incorporates an internal full rate clock synthesizer.
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4/8 Channel 1.0 ~ 30.0 Gb/s Pulse Pattern Generator and Error Detector
CA9808C
The UC INSTRUEMNTS CA9808C 4/8 Channel 1.0 ~ 30.0 Gb/s pulse pattern generator and error detector is a high performance, flexible and cost effective four channel Pulse Pattern Generator and Error Detector that can operate from 1.0 Gb/s to 30.0 Gb/s each Channel. 4/8 channel 30.0 Gb/s make it total up to over more than 120/240 Gb/s testing capacity. It is also a standalone Bit Error Rate test solution that incorporates an internal full rate clock synthesizer.
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NTSC PATTERN GENERATOR
PG-38
Model PG-38 NTSC Pattern Generator can be use to quickly and easily troubleshoot, test, and align NTSC television. Features a wide selection of popular video patterns including Color Bars, Crosshatch, Dot, Staircase, Circle, Center Cross, Window, and Raster for accurate and comprehensive TV troubleshooting and testing. Supports both progressive and interlace scanning system. Composite video and S-Video output. RF video output on Channel 3 with 1KHz audio tone for audio troubleshooting. User friendly interface for easy operation.
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Brahmos Checkout
Data Patterns designed and built the BrahMos Missile Checkout Equipment based on the requirements and support of DRDO and BrahMos. This unit validates the complete performance of the Missile through interfacing with it's umbilical and maintenance connections. The shelter mounted checkout equipment is utilized to test the articles on the field during it's life cycle, thus ensuring readiness for launch on demand.
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Pulse Function Arbitrary Noise Generator
81160A
Generation of 330-MHz pulses and 500-MHz function/arbitrary waveforms with a 2.5-GSa/s sample rate and 14-bit vertical resolution; Selectable crest factors for white Gaussian noise lets engineers determine how much distortion to apply to a device during stress testing to meet various serial bus standards; Glitch-free timing parameter changes allow engineers to change the frequency without drop-outs or glitches and enable continuous operation without rebooting or resetting the device under test; ...show more -
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Virtual Test Methodology
TVT
With TVT, you don''t have to wait for the physical device to start validating your ATE test patterns, or verifying the device interaction with the tester.
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ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1 Small (Hold-Down Gate) / 230154
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Digital Test Instrumentation
EDigital-Series™
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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AMIDA 2020XP Tester
AMIDA 2020XP CIS tester is the latest generation of CMOS image sensor-specific measuring instruments from Metatech. In addition to the original true and accurate measurement, the high-throughput mass production solution designed for the high-throughput inspection of image lens modules and camera lenses has been well received after nearly 20 years of mass production experience. First-class factories at home and abroad import production. AMIDA 2020XP CIS testing machine not only meets the customer...show more -
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Video Test Pattern Suite
Sarnoff®
In the digital era, traditional video test and measurement tools are becoming obsolete. SRI offers a suite of unique visual tools that enable users to stress, evaluate, and calibrate audio and visual equipment throughout the signal chain. Test pattern products include the award-winning Visualizer digital video test pattern, the ESP encoder stress pattern, and the TSG test sequence generator.
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Antenna Measurement Software
Raymond RF's Antenna Measurement Software performs 2-D (polar/rectangular) and 3-D (spherical) antenna pattern measurements for passive antennas and active wireless mobile stations (cell phones). Insertion loss of passive devices is included as part of the calibration component. Data management and reporting of antenna properties such as half power beam-width, directivity, gain, radiation efficiency, total radiated power, and total isotropic sensitivity. AMS performs and reports all measurements required by the CTIA Over-the-Air Performance Test Plan.
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Micro Compression Tester
MCT Series
This is a strength evaluation tester for micro parts and micro particles generated in powder processing. It is capable of carrying out not only compression tests, but also loading and unloading tests, repeated tests, and various other load patterns, with excellent operability and functionality.
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Manual and Automated Testing
Good automated tests start with good manual tests. Manual Testing requires creativity, perseverance, pattern perception and exploration. Automated Testing requires repetition, speed and structure. Both methods of testing require attention to detail. Our diverse workforce is well-suited for both types, and we utilize the strengths of each individual in different areas.
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Video Signal Generator
MSPG-101
MSPG-101 portable tester is powered with built-in battery and DC power. Usef test to varied combination timings and patterns. MSPG-101notify TMDS information by accept input signal.
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D-SUB (Male)
QSPI
The QSPI represents a multi-function of performance and capabilities for PXI-based digital instrumentation. The QSPI offers high performance pin electronics and 4 I2C masters and 4 32bit counter 4 clock generator in a compact, 3U PXI form factor. Each card can function as a quad sites I2C/SPI device tester, multiple cards can be interconnected, supporting up to 64 sites. The QSPI also supports deep pattern memory by offering 32M of onboard vector memory with dynamic per pin direction control and with test rates up to 10 MHz.
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HDMI / 3G Reference Media Player
VQS-300
Versatile destop/rackmount unit, loaded with unique sophisticated set of static and dynamic test patterns - see more details in separate VQL for VQS Presentation Multi-format HDMI and 3G-SDI outputs, digital and analog AV outputs 2.5 ppm accurate system clock to meet full 3G-SDI broadcast specs Front side bay for detachable SATA HDD – up to 2 TB of content VQL - Library of unique sophisticated dynamic test patterns and sequences LIve clips and 3D Video Tests, 5.1 Surround Sound and LR Stereo Audio Tests All commonly used resolutions, aspect ratios, frame rates and interlace modes Easy expansion with any external USB storage device: BD/DVD, HDD, FD.
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Astronics PXIe-6943, 1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument
785855-01
1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument - The Astronics PXIe-6943 works as a core component of digital test systems that may include switching, analog instrumentation, and an RF subsystem. This instrument features an advanced thermal design, temperate monitoring, … and a high-speed data sequencer for control of stimulus and response patterns. Additionally, the Astronics PXIe-6943 operates at data rates up to 50 MHz with 1 ns edge placement, variable slew rates, and a <3 ns channel-to-channel skew. It also supports synchronized digital test systems from 32 to 224 channels.
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Continuous Time Interval Analyzer - PXI
GT668PXI-40
A true breakthrough in high-speed Time Measurement and test technology, GuideTech’s GT668PXI-40 leverages the power of its CTIA continuous time-stamping technology, eliminating the need for supplemental triggers, pattern markers or clock recovery circuits.GuideTech’s CTIAs enables serial interfaces pattern verification and full jitter analysis in milliseconds for fast, automated characterization and high-throughput production test on all ATE platforms, including low-cost and in-house testers.GT668PXI-40 cards can be expanded up to 36 Channels Single Ended Input in a single 3U PXI chassis.
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Pattern Generator
S-113
The Pattern Generator slot module of FOTS system is an efficient module for the characterization and test of external optical components and systems to be performed in high bit rate. This module is a kind of pattern generator and bit error rate tester that can be used to modulate optical components or systems and to test the bit error rate characteristics of optical systems or optical lines. This pattern generator slot includes two differential Tx/Rx channels, which can be operated simultaneously.