Test Development
Create and run Tests made for the environment you are assessing.
See Also: Development, Software Development, Developers, Development Boards, ATE Integration
- Pickering Interfaces Inc.
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PXI & LXI Simulation Tools
Our PXI & LXI simulation tools help you to accelerate the development process by simulating the product in your test system. These tools allow you to develop and test the system software independent from your application hardware. By using the tools, you can minimize the time required with the physical system.
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ScanWorks Boundary-Scan Test
ScanWorks Boundary-Scan Test
The Boundary-Scan Test (BST) Development Software is one of the several configurations of the ScanWorks boundary-scan (JTAG) test and on-board programming environment. Test engineers can quickly develop interconnect tests and device-programming actions for use on first prototype board to accelerate the board bring-up process. Then tests can be exported for use in manufacturing and repair facilities.
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EMC Testing
Does your product send or receive electromagnetic data? This can be analyzed using various tests. We investigate the interference immunity and emitted interference of simple electrical devices and complex machinery. Our EMC measurements and tests conducted in accordance with standards recognize all activity in the electromagnetic field and ascertain how immune to interference a piece of equipment is. We will also offer guidance on optimizing the product in terms of its EMC properties during the development phase.
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Simulators
SAE J1708/J1587
The Au SAE J1708/J1587 simulators (Gen II, V1.00A release) can simulate up to 44 most frequently used Engine/Transmission/ABS parameters, warnings and diagnostic messages. Up to six Engine MID, three transmission MID and six ABS MID can be field configured. All editions can run independently (without personal computer). This family of simulators are designed very easy to use. It is widely used as valuable tools for any situation from product-line test, incoming inspection, business demonstration to product development and product validation.
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Silicon Nails Feature Development And Runtime, GTE 10.00p
K8228B
The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.
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Comprehensive Suite of Software Tools for Semiconductor Test Applications
ICEasy Test Suite
Marvin Test Solutions' ICEasy Test Suite is supplied with both the TS-900 and TS-960 semiconductor test platforms and provides a comprehensive set of software tools - facilitating the development and debugging of test programs for semiconductor devices. In addition the suite includes I-V curve and Shmoo plot tools for analyzing a device's DC and AC characteristics. The complete suite of tools interfaces seemlessly with Marvin Test Solutions' ATEasy®, a test executive and test development evironment which is supplied with each TS-900 / TS-960 system.
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PXI Signal Generators (Signal Sources)
Accelerate test throughput with fast, high-quality measurements optimized for RF or microwave design validation & manufacturing testIncrease test configuration flexibility with a PXI platform and license key upgradesReduce development time with easy integration of drivers and programming examples into test environments
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SMH Type Biaxial Tension Tester
It is a biaxial tension tester dedicated to this test that conforms to ISO 16842: 2014 "Double-axis tension test method using cruciform specimens of thin sheet steel". National university corporation Tokyo University of Agriculture and Technology industry-university joint research and development product product
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IEC61850 Digital Substation Testing
With the development of power system, more and more digital substation based on IEC61850 has been built in the world. IEC61850 is the new communication protocol which is adopted by power system so as to change the analog complicated wiring connection and protocol conversion. Based on IEC61850, all Messages, such as GOOSE, SV, MMS, PTP, etc, could be communicated on the Ethernet via fiber optical cable connection. In China, the digital substation have started since 2003, until now there are alrea...show more -
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Antenna Products
NSI-MI Technologies has an extensive history in the development of innovative antennas for precision antenna test and measurement applications, as well as other wireless applications. NSI-MI antennas are designed, developed and manufactured in our factory by our talented staff of antenna design engineers with decades of experience. Our antenna products and services fulfill the needs of numerous markets, including the military and defense, aerospace, automotive, satellite communications, and wireless industries.
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Clamping Force Tester
KRD102
KRD102 series clamping force tester is an indispensable test method for improving products into high-quality fields. It is suitable for research, development, quality control and manufacturing of electronics, electromechanical, optoelectronic, automotive, toy, packaging and other industries. It can simulate the situation that the goods in the container are clamped when they are transported from the container to the warehouse. Whether the goods are damaged due to the clamping, so as to evaluate the anti- clamping ability of the packaging.
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Superior Electromechanical Universal Testing Machine
WDW-S Series
Jinan Testing Equipment IE Corporation
WDW series computer control electromechanical universal testing system for tension,compression, flexure testing is designed according to ASTM, ISO, DIN, EN standards etc.. The electromechanical universal testing system for tension,compression, flexure testing is computer-controlled and precision. Our electromechanical universal testing system for tension,compression, flexure testing is widely suitable for metallic and nonmetallic materials for tension, compression, bending, shearing and low cycl...show more -
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Stackable Single Slot Test Fixture
Stackable Single Slot Test Fixture: Testing, Development, and Validation. The VITA 48.2-compliant Single Slot Test Fixture can be used for development, validation, and environmental testing. It is available in VPX, VME, CompactPCI, or custom form factors and can be vertically or horizontally mounted.
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Adapter/Stainless Steel
WADP-24F35F
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Engineering Support Platform
ESP
ESP, or Engineering Support Platform, is a low cost, powerful and versatile platform for the development, deployment and support of FPGA Applications. ESP is powered by DSX core, ARC’s core element for the development and deployment of digital and mixed signal systems. The standard system contains 2 custom FPGA system, often configured in combination where one acts as the application firmware, and the other is used for test. But the system is expandable and configurable in any combination to sol...show more -
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Battery Testing Chambers
We supply a variety of test chambers for testing small battery cells to large lithium ion battery packs. Battery test chambers are supplied to a variety of industries including telecommunications, computer and automotive. With the goal of reducing automobile emissions and the development of electric vehicles, the need for lithium ion battery testing is even more critical. Our proven experience provides the most cost-effective solutions. Each test chamber is built according to specific test requi...show more -
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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PCIe Adapters
Teledyne LeCroy offers a broad spectrum of PCI Express protocol analyzer platforms (Summit T516, Summit T54, Summit M5x, Summit™ T416, Summit T48, Summit™ T3-16, Summit T3-8, Summit T34, Summit T28, and Summit T24). The Summit T516, T54 and M5x are Teledyne LeCroy’s leading edge products supporting PCIe 5.0 and CXL specifications. The Summit T416, T48, T34, T3-16 and T3-16 are Teledyne LeCroys midrange protocol analyzers. These protocol analyzers are at the forefront of SSD and computer storage analysis, test and compliance. The Summit T28 and T24 are entry level protocol analysis tools for development and test at PCIe 2.0.
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Adapter/Stainless Steel
WADP-NFNF-BH
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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LabVIEW Programming Service
DMC has successfully employed LabVIEW in many industries, including product development, R&D, high-tech manufacturing, and test engineering. Following are a few relevent examples: Laboratory Automation; Carbon Monoxide Detector Testing, Strobe Light Testing, Multi-Station Permeability Test Stand, Hydraulic Fluid Tribology Testing. Manufacturing Automation; Engine Cold-Test Characterization, Smart Battery Pack Manufacturing Test, Automotive Sensor Testing.
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Optical Equipment
It is intended for the organization of multiservice, hybrid, optical-coaxial cable networks. Years of development and research in this area have allowed Planar LLC to create a product line that covers the widest range of applications. All equipment is an outstanding example of the high technology of Planar LLC, each of the models is the result of intensive research and lengthy tests. This synthesis of technical sophistication and daily labor practically means that all equipment is highly reliable and exceptionally cost effective.
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SSD Test Systems
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester impr...show more -
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In-Circuit Test Application Development & Fixture Fab
Arxtron Technologies has been in the Agilent3070/HP 3070 (Medalist i3070) In-circuit test application development and fixture fabrication business since 2004 when it took over the Agilent Canadian application centre. Our engineers count more than 35 years of experience and have been serving a variety of customers focusing on high end/ high node count complex products (Telecom, Medical, Industrial computers etc.) as well as Automotive and consumer electronics customers. We are also an Agilent channel partner.
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RF Diagnostic Chamber
DST200
The R&S®DST200 RF diagnostic chamber is the ideal environment for RF analysis during development. It supports a wide range of radiated test applications for wireless devices and fits on any R&D lab bench, where it can be used at all times during the product design and optimization phase. The R&S®DST200 effectively assists in achieving high first-time pass rates during final type approval, which saves time and money.
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Full Range Active Thermal Control Handler
3110-FT
Chroma 3110-FT is an innovative pick & place system ideal for characteristics evaluation, development, and IC final test.
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Aerospace & Defense ATE Systems and Services
TE solution design, development, and integrationMeasurement / Test Process analysis and consultationEasy-to-use software interfaces for Engineers and UsersFactory automation for test processesAll major instrument brands available & supported
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NightStar Tools
Debugging and analysis tools that reduce test time, increase productivity and lower development costs.
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Login Digital Epstein Tester Model
Model EP400
Digital Epstein Tester EP-400 is designed to measure AC magnetic properties of flat rolled magnetic materials at high frequency by using Watt-meter, Ammeter, Voltmeter and Source. Epstein bridge test method is a fundamental method for evaluating the magnetic performance of flat-rolled magnetic materials in either sheared or stress relief annealed condition. This test method is suitable for design, specification acceptance, service evaluation, and research and development.
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VXT PXIe Vector Transceiver
M9421A
Purpose-built for rapid solution creation and faster throughput in manufacturing test of wireless components, power amplifiers, and RF front-end modules Increase test density and reduce your footprint with up to four VXT instruments in one 18-slot chassis Reduce development time with open-source test libraries and reference solutions Start closer to your finish line with built-in FPGA-accelerated measurements Optimize test routines using proven software for noise figure and standard-specific measurements
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AMIDA 3001XP Tester
AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and m...show more -
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INSTRUMENTATION AMPLIFIERS
EMC HIRF testing – meeting the most demanding RTCA/DO-160 requirementsScientific ResearchHigh Power Component Testing (PIM Testing)Medical LINACSRecent developments include a range of Ultra High Power HIRF amplifiers achieving generally over 10 kW. EMC test laboratories using TMD Amplifiers have generated 14,000 V/m, easily complying with the latest, most demanding RTCA/DO-160 requirements.
