Filter Results By:
Products
Applications
Manufacturers
Spring Probes
Spring loaded electrical conductor contacting elements. AKA: Pogo Pin
See Also: Pogo Pin, Test Fixtures, Bed of Nails
-
product
Custom Pogo Pin Rings & Blocks
Reduce your cost-of-test with our pogo pin blocks and interfaces that transform complex DUT boards or breakout boards into universal motherboard-style interfaces. Eliminate the need to purchase or build a new board for every unique device, unit, or package.
-
product
Expanding In-Circuit Capabilities
Circuit Check supports reading linear bar codes and 2D symbols within each of its fixture product lines.When spring-loaded probes are not practical or access is limited, Circuit Check can help you with thru-connector tests to contact connectors on any surface or edge of a circuit board. These tests can be implemented spring probes, mating connectors, sacrificial SMT connectors, and stabber cards.
-
product
High-Current Leaf Spring Probes
Made for flat contacts - fully customizable - great contacting.
-
product
Hybrid Socket
CSP/Ballnest
Any grid size available on 0.50mm pitch or larger. ZIF style socket using Aries solderless, gold plated pressure mount Spring Probe. The gold over nickel plated compression spring probes leave very small witness marks on the bottom surface of the device solderballs.
-
product
Ingun Spring Probes
MicroContact AG offers the assortment of test probes and test adapters from Ingun as a Swiss representative.
-
product
Mechanical Test Head Housing
a result of more than 10 years' experienceavailable with integrated manipulatorfully integrated docking and board lockingtest housing mechanics design as per customer specificationssuitable for individual and high-volume productionstandard and customized dimensionsno limitation in size and electrical power capacitiesquick and easy locking and unlocking process for board changelarge application space load boardoptional number of channel boards as per customer specificationsfamily/DUT board connection achieved by high-end double-ended spring probes - 50 Ohmhigh-end cooling fansfacilitated adaptation with all available manipulator solutionsdocking design in compliance with customer internal docking standards/dimensionsdocking force as per customer specificationscenter of gravity fully compensated
-
product
Pogo Pin
Probe pin is also known as pogo pin or spring probe. It is designed to test the connection between two circuit boards and devices or equipment under test.
-
product
Probe Card
VS Series
Japan Electronic Materials Corp.
*Vertical contact Probe Card with Spring*Suitable for Area array Bump Test
-
product
Screw Pins
C.C.P. Contact Probes Co., LTD.
CCP's Screw Pin is an extremely smart way to utilize a pogo pin as a connector as well as a mounting part.
-
product
Semiconductor Probe
Using the spring contact probes for semiconductor package inspection, customers can test various types of packages with LEENO's Total Interface Solution.
-
product
Spring Contact Probe
ICT
LEENO provides a variety of choices, offering over 1,000 standard ICT probe types. The ICT probes can be customized to deliver optimum solutions to customers.
-
product
Spring Contact Probes
We differentiated the spring contact probes by center and application, for the purpose of clarity. Please choose in the left navigation bar!
-
product
Test & Burn-In Socket for Devices up to 13mm Square
CSP/MicroBGA
Test & Burn-In Socket. Socket is easily mounted and removed to & from the BIB due to solderless pressure mount compression spring probes which, are accurately located by two molded plastic alignment pins and mounted with four stainless steel screws. Standard molded socket format can accommodate any device package of 13mm or smaller, by using machined (for small quantities) or custom molded (for large quantities) pressure pads and interposers.
-
-
product
Passive Probe
ENVI
PMK Mess- und Kommunikationstechnik GmbH
The world's first modern probe for this high temperature range is suitable for a variety of applications with an input voltage range of 400V / 1250V peak, 10:1 divider and 350MHz bandwidth.The individual and signal-true contacting for different applications is guaranteed by the exchangeable spring tip and a variety of contacting accessories.
-
product
24V Heavy Duty Circuit Tester
27430
Heavy duty probe, cord and clamp. The probe is insulated with high-visibility shrink tubing to prevent the possibility of shorting the side of the probe to other components. Comes with a strain relief spring on the cord.
-
product
Active probe 50 Ohm Differential SMB
80609010
The differential active probe helps to carry weak HF signals far away with the minimum disturbance of the original source. The module accepts discrete wiring or direct spring loaded test probe solder. In any case, the input signal wires might be as short as possible.
-
product
Active Probe 50Ohm Single Ended SMB
80609000
The single ended active probe helps to carry weak HF signals far away with the minimum disturbance of the original source. The module accepts discrete wiring or direct spring loaded test probe solder. In any case, the input signal wires might be as short as possible.
-
product
Active Probe 75Ohm Single Ended SMB
80609007
The single ended active probe helps to carry weak HF signals far away with the minimum disturbance of the original source. The module accepts discrete wiring or direct spring loaded test probe solder. In any case, the input signal wires might be as short as possible.
-
product
Automatic Semiconductor Probe Assembly
This is the fully automatic semiconductor probe assembly and test equipment. It features ultra high precision in assembly process and the intelligent inspection of the finished products. This product is one of the most technologically advanced equipment by international standards in this industry and been exported to North America.Key Features: ● Assembly Precision：15um ● UPH:720 ● Visual Inspection included ● Spring Force Test
-
product
MEMS Spring Probe
MEMS Spring Probe is developed by NIDEC-READ original ultra-fine 3D processing technology and enables our customer to supply advanced and innovative test solutions at PCB & semiconductor testing market.
-
product
Spring Contact Probes
FEINMETALL offers a wide range of contact probe:ICT / FCT probes, short travel probes, double plunger probes, fine pitch probes, interface probes, wire harness probes, threaded probes, high current probes, switch probes, twist proof probes, push back probes, koaxial probes, radio frequency probes.
-
product
PCB Connectors
Smiths Interconnect offers a broad range PCB connectors for harsh environments. A wide choice of configurations and terminations of signal, power, high speed, RF contacts and spring probes solutions.
-
product
Microcontactor
Microcontactor is the products using a new structure precision probe developed by NHK Spring. They are used to test the electrical characteristics of semiconductor wafers and packages. Products are manufactured in our own factory and can be custom-designed to meet our customer needs.
-
product
Switch Probes
A Switch Probe is a spring contact probe and receptacle combination that is normally open, and after a designated travel the switch probe closes. The most common use for switch probes is in the cable harness testing industry. The switch probe is used to verify the correct location of a terminal in a connector while checking the retention force as well. Switch probes also verify the presence of nonconductive components such as caps for connectors or devices on a circuit board. Smiths Interconnect offers three standard sizes of switch probes.
-
product
Spring Probes
Spring probes are designed to optimize performance in high reliability, multicycle applications. Smiths Interconnect's spring probes, featuring IDI contact technology, are compliant which makes them ideal for blind mate applications as they self correct for x, y, z, rotational and angular misalignment of the target. Offered in compressed heights less than 2 mm and utilized on pitches as tight as 0.4 mm, they are well suited for high density, board-to-board, battery contact and high frequency applications.
-
product
High Speed Contacts
Our quadrax, twinax, spring probe, coax, triax and fiber optic contacts can be sold seperately or configured into any of our standard connector shells sizes as well as cable assemblies and harnesses.
-
product
Connectors
Through our Hypertac, IDI and Sabritec technology brands, we supply application-specific, high-reliability electrical interconnect solutions from highly integrated assemblies to microminiature connectors and spring probe contacts. The core of our advanced interconnect solutions is our contact technologies: Hyperboloid, Tortac, Spring Probe, High Speed, Edge Card, Fiber Optic, EMI/EMP, High Power and High Temperature.
-
product
I-V Measurement Systems
The I-V Curve Data Acquisition includes a fixture for holding cells for testing (see Figure 1 below). This fixture can accommodate cells from small to up to 100 mm x 100 mm. Adjustable cell stops, in the X & Y-axis, are provided to consistently locate the cells for testing. Two micro-manipulators are provided as shown in Figure 1. Each micro-manipulator has two spring loaded contacts to allow 4-wire measurement even for cells that have top contacts only. Two back-side voltage contacts are embedded in the Plate (galvanically isolated from the Plate) and make good electrical contact when the cell is held down by vacuum to the plate. All voltage and current probes are gold-plated. The cell is held down with vacuum during testing (built-in vacuum pump).
-
