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Multi Function Tribometer
MFT-5000
The state of the art Rtec Multi Function tribometer Mft-5000 is globally regarded as the most versatile and technologically advanced tribometer. Manufactured at silicon valley, California it is used by several top labs, universities and industries. The tribometer offers next generation patented force sensors with ultra low resolution, highest speeds and wide environmental control range than any other commercially existing tribometer. The patented integrated 3D profilometer allows to analyse surface change vs time. The universal tribometer MFT5000 allows to create a comprehensive report on friction, wear, tribology and surface analysis.
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Optical Profilometer
NanoMap-WLI
White light interferometer- brings high resolution. 4 million pixel image, large scanning range, customizable wavelength range to give users flexibility to image any kind of surfaces with ease.
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Universal 3D Profilometer
NanoMap-D (Dual mode)
NanoMap-D (Dual mode) takes imaging to next level. It brings competing techniques – contact and optical profilometer - on one platform. Automatic sample movement and one click measurement, makes NanoMap-D a step forward in imaging world.
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Optical Profilometers
Profilm3D® and Zeta™ optical profilometers provide fast, easy, non-contact solutions for 3D surface topography measurements. Our portfolio of optical profilers supports a variety of measurement techniques, including white light interferometry, True Color imaging and ZDot™ confocal grid structured illumination. KLA Instruments can help guide you to the right optical profiler solution for your unique needs.
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Profilometry
Laser triangulation is a non-contact distance measurement technique widely employed for surface inspection applications.We've been working to develop a laser triangulation extension, to provide our customers a fast and reliable solution for their measurement and quality inspection issues. Our Optical Profilometer extension enhances the robust and flexible platform of our standard cameras: you can get all the quality of Alkeria cameras, along with all brand new functionalities!
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Atomic Force Microscope
LensAFM
The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments.
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3D Contact Profilometer
NanoMap-LS
NanoMap-LS with large scanning range allows to generate high resolution 3D and 2D images with a press of a button.
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3D Profilers
AEP Technology offers different kinds of 3D profilers. Rugged platform, advanced electronic equipment, clean test space, low carbon emission, low machine noise, high-end lens, etc., make our surface profiler unique in the imaging world. In addition to providing stand-alone contact 3D profilers and optical 3D profilers, we also provide the world's only cross-platform, dual-mode 3D profiler that is compatible with both tactile and optical profilometers.
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Precise 3D Profilometry
µscan
Using the NanoFocus µscan technology, you can measure up to 100 times faster than with conventional probe systems. Various µscan sensors are available for the different application areas. The optical profilometers of the µscan series are suitable for the fast scanning of surface profiles with precision in the low nanometer range.
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Profilometer
NANOVEA Optical Profiler is a 3D, non-contact profilometer designed with Chromatic Confocal technology, which uses wavelengths of light to accurately determine physical height. The Optical Profilers NANOVEA offers include compact, stand-alone and portable profilometer models. High-speed sensors are available to scan large surface at high accuracy.
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Profilometer
MicroCam™
MicroCam™ fiber-based optical non-contact 3D profilometers deliver: High-Speed Non-Contact Surface and Cross-Sectional Inspection 3D Online Measurements, GD&T and Imaging Long Stroke Profilometry with Sub-Micron Resolution Thickness, Roughness and Vibration Measurements Fiber-based Probes which reach into Bores, Tubes, and Crevices
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Stylus Profilometers
Tencor™
KLA Instruments™ Alpha-Step®, Tencor P- and HRP®-series stylus profilometers deliver high-precision, 2D and 3D surface metrology, measuring step height, surface roughness, bow and stress with industry-leading stability and reliability for your R&D and production requirements.
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Optical Profilers
Finally, measurements of surface roughness and topography can be made for a price that's less than that of a stylus profilometer. The Profilm3D has sub-nanometer vertical resolution, which surpasses optical profilometers that cost 3x as much. It does so by using the same state-of-the-art measurement technologies as the most sensitive optical profilers available: vertical-scanning interferometry (VSI) and phase-shifting interferometry (PSI).
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CMP Tester
CP-6
The state of the art Rtec CMP tester CP-6 allows to study and characterize CMP process like never before. In addition to polishing wafers & substrates the tester comes with inline surface profilometer. This combinations sheds information on why and how the surface, friction, wear etc. changed. Tester also measures several inline parameters such as friction, surface roughness, wear volume etc. to understand the process in detail.
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Portable Surface Roughness Tester Profilometer
SRG-2000
The PHASE II SRG-2000 surface roughness tester profilometer is a pocket-sized economically priced instrument for measuring surface roughness texture conforming to traceable standards. It can be used on the shop floor in any position, horizontal, vertical or anywhere in between.
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Portable Surface Roughness Tester Profilometer
SRG-4000
The latest in state-of-the-art surface roughness testers profilometer, the SRG-4000 is designed with the shop environment in mind. These surface roughness testers profilometer are distinguished by a high level of accuracy, multiple parameters and simplicity of operation. Extremely sensitive and highly accurate readings from this Phase II surface roughness tester are offered via multiple surface roughness profilometer parameters, Ra, Rq(Rms), Rt and Rz.
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Surface Roughness Tester Profilometer
TIME®3231
Beijing TIME High Technology Ltd.
TIME® 323X series is advanced high-end surface roughness measuring instruments with wide testing range (±400µm) and high accuracy (tolerance±5%, repeatability 3%). Meanwhile, TIME® 323X surface roughness tester features with skidless/skid measurement, which means it can reach smaller and harder to reach parts than other conventional tools. Up to 55 paramenters for roughness, waviness and primary profile are supported. Apart from those features mentioned above, TIME®3231 is loaded with 90° measurement function.
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Personal Workstations for Load Ranges up to 440 lbs.
9200 Series
The 9200 Series Vibration Isolation Workstation is a smaller, more compact design providing affordable personal convenience. The 9200 is ideal for applications such as Balances, Optical Microscopes, Cell Injection, Roundness Checkers, and Surface Profilometers.
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