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product
Electron Microscope Analyzer
QUANTAX EBSD
QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM
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EBSD Detector
e–FlashFS
The new EBSD detector e–FlashFS has been designed for maximum sensitivity to allow highspeed EBSD measurements without compromising data quality – even on challenging applications like deformed or lightweight materials. To further improve the pattern quality, the cooling system of the e–FlashFS has been upgraded to lower its functioning temperature and therefore reduce the dark current of the CCD camera as much as possible.
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EBSD tools
EDAX EBSD tools provide leading performance and groundbreaking technology for analyzing crystallographic microstructure, using electron backscatter diffraction in the SEM.
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Electron Backscatter Diffraction (EBSD) Camera
Velocity™
high-speed EBSD mapping with the highest indexing performance on real-world materials. Velocity™ EBSD camera combines indexing speeds greater than 3,000 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity™ uses 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with proven EDAX triplet indexing routines, provides orientation precision values of less than 0.1°.
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Analysis System
Trident (EDS-EBSD-WDS)
The Trident Analysis System combines the latest advances in Energy Dispersive Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), and Wavelength Dispersive Spectrometry (WDS) in a single analytical tool. With the Smart Features included in the easy to use EDAX analysis software, each technique can be optimized and used independently or they can be combined to provide seamless integration, resulting in comprehensive data collection that can then be shared between the different techniques.
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Pattern Region of Interest Analysis System
PRIAS
PRIAS is a synergistic new imaging technique to visualize microstructure and provide exciting new views of your materials. PRIAS enables users to quickly characterize materials without requiring full EBSD pattern indexing. Through a novel use of the EBSD camera, PRIAS provides as many as 25 positional electron detectors to allow unprecedented flexibility in image collection and visualization. Applications of PRIAS include traditional EBSD materials such as metals, ceramics, semiconductors, and minerals as well as new analysis of plastics and glasses.
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The Ease of TEAM with the Power of Orientation Imaging Microscropy (OIM)
TEAM™ Pegasus
Introducing the new EDS and EBSD Integrated System
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Analysis System
Pegasus (EDS-EBSD)
The Pegasus Analysis System enables the simultaneous collection of Energy Dispersive Spectroscopy (EDS) (chemistry) and Electron Backscatter Diffraction (EBSD) (crystallography) data, allowing direct correlation between the elemental content and microstructural aspects of the material being studied.
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EBSD Detector
Symmetry
Electron backscatter diffraction – is a powerful microanalysis technique that enables rigorous characterisation of the micro structural properties of crystalline materials. A high performance EBSD detector is critical for the effectiveness of the technique, influencing both speed and data quality. Symetry is Over 3000 indexed patterns per second (pps). Up to 30x faster than existing CCD-based detectors. Extreme sensitivity for low current and low kV analyses. Megapixel resolution for HR-EBSD applications. High resolution patterns (at least 156 x 128 pixels) at all speeds.
