Helmut Fischer AG
"Measuring Made Easy". According to this motto, market leading Helmut Fischer Group has been developing and manufacturing high-precision measuring instruments for coating thickness measurement, material analysis, materials testing and microhardness for industry and laboratories.
- 49 7031 303 0
- mail@helmut-fischer.com
- sales.de@helmut-fischer.com
- Industriestraße 21
Sindelfingen, 71069
Germany
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product
Benchtop Unit for Universal Coating Thickness Measurement
FISCHERSCOPE MMS PC2
Multifaceted for coating thickness measurement and material testing. Universal multi-measuring system for parallel coating thickness measurement and material testing with up to eight measuring modules.
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Compact Coating Thickness Gauges
MP0 Series
The small all-rounders for mobile coating thickness measurement. Leading industrial instrument series for fast and easy coating thickness measurement in corrosion protection and industrial applications.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE X-RAY XULM
Flexible measuring devices for coating thickness measurement of filigree parts like plugs, contacts or wires as well as for the determination of the metal content of electroplating baths and the composition of simple alloy layers.
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Nanoindentation Testing in the Micrometer RangeFISCHERSCOPE
FISCHERSCOPE® HM2000
Nanoindentation for professionals. Reliable hardness measuring instrument for determining properties such as indentation hardness and the depth-dependent elastic indenter modulus – and all of that in the nanometer range.
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Handheld Gauge for Nondestructive Coating Thickness Measurement
PHASCOPE PMP10 DUPLEX
The professional for duplex measuring. The specialist for measuring the thickness of duplex layers from automotive to roof panels.
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Portable X-RAY Fluorescence Measuring System
FISCHERSCOPE® X-RAY XAN® 500
Mobile and universal handheld device for precise coating thickness measurement and material analysis - even with difficult material combinations.
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Premium Handheld Coating Thickness Gauges
DUALSCOPE® FMP100 and H FMP150
Coating thickness measurement at the highest level. The device series for maximum flexibility and control in coating thickness measurement. Ideal for the use of inspection plans.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
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Automation Solutions
We have customized (partially) automated measuring solutions that can be fully integrated seamlessly across all levels of your plant – from cleanroom-compatible measuring systems for automated production to robot-assisted probes in thickness measurement. Whether X-ray, terahertz or electromagnetic, random sampling or 100 % inspection: We offer measurement technology that allows you to inspect surfaces quickly and under constant conditions, save time and costs and ensure the quality of your production.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY 5000
Inline measuring with highest precision for thin films. Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.
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Measuring Devices For Nanoindentation
With our measuring devices, you can determine the mechanical properties of thin coatings reliably and accurately. From protective paint coatings to hardness of PVD coatings: We have the right solution for you. We offer you powerful and easy-to-use measuring instruments for the laboratory and production. You can choose from a wide range of accessories to adapt your device to your individual requirements.
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X-ray Fluorescence Measuring system
FISCHERSCOPE® X-RAY 4000 Series
Inline measuring with maximum endurance. Robust inline device for measuring on solid strips, punched grids with measuring structures from a few millimeters up to coated membranes or solid strips up to one meter wide.
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X-ray Fluorescence (XRF) Measuring Instrument
FISCHERSCOPE XDV-µ
Smallest measuring surface, greatest precision. Universal instrument for measuring on smallest and flat components and structures as well as complex multilayer systems.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDLM®
Universal instrument for inspection of small parts and small structures, measuring of light metals, hard coatings and thin electroplated parts.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDAL®
Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
