Reedholm Systems
We have focused on dc test systems used by semiconductor manufacturers to make measurements on electrical test structures.
- 512.876.2268
- info@reedholm.com
- 1956 S. Austin Ave.
Georgetown, TX 78626
United States
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Wide Band Gap Production System
Reedholm has configured an integrated system, not just a set of boxes, for testing high power devices at the wafer level. Sophisticated testing, prober control, and database management do not carry a programming burden. As a result, fast, automated wafer testing is done in an inexpensive, compact probing platform.
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PCM Test
We make DC test systems used by semiconductor manufacturers to make measurements on electrical test structures and simple devices. Because of the broad application of test structures, our test systems help assure quality and reliability in process development, wafer acceptance testing, reliability evaluation, and dc final test.
